Arama Sonuçları Integrated circuits--Testing. - Daraltılmış: Testen.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dIntegrated$002bcircuits--Testing.$0026qf$003dSUBJECT$002509Subject$002509Testen.$002509Testen.$0026ps$003d300?2025-12-26T08:38:13ZVLSI test principles and architectures design for testabilityent://SD_ILS/0/SD_ILS:2537792025-12-26T08:38:13Z2025-12-26T08:38:13ZYazar Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123705976">http://www.sciencedirect.com/science/book/9780123705976</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Digital circuit testing a guide to DFT and other techniquesent://SD_ILS/0/SD_ILS:2552342025-12-26T08:38:13Z2025-12-26T08:38:13ZYazar Wang, Francis C.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127345802">http://www.sciencedirect.com/science/book/9780127345802</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>