Arama Sonu&ccedil;lar&#305; Integrierte Schaltung. - Daralt&#305;lm&#305;&#351;: Integrierte Schaltung. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dIntegrierte$002bSchaltung.$0026qf$003dSUBJECT$002509Konu$002509Integrierte$002bSchaltung.$002509Integrierte$002bSchaltung.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?dt=list 2024-12-27T15:09:31Z Integrated passive component technology ent://SD_ILS/0/SD_ILS:249780 2024-12-27T15:09:31Z 2024-12-27T15:09:31Z Yazar&#160;Ulrich, Richard K. (Richard Kevin), 1955-&#160;Schaper, Leonard W.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5426840">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5426840</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of quality integrated circuit manufacturing ent://SD_ILS/0/SD_ILS:255078 2024-12-27T15:09:31Z 2024-12-27T15:09:31Z Yazar&#160;Zorich, Robert.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127818702">http://www.sciencedirect.com/science/book/9780127818702</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Trace theory for automatic hierarchical verification of speed-independent circuits ent://SD_ILS/0/SD_ILS:220184 2024-12-27T15:09:31Z 2024-12-27T15:09:31Z Yazar&#160;Dill, David L.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267249">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267249</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> VLSI handbook ent://SD_ILS/0/SD_ILS:255114 2024-12-27T15:09:31Z 2024-12-27T15:09:31Z Yazar&#160;Einspruch, Norman G.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780122341007">http://www.sciencedirect.com/science/book/9780122341007</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Logic testing and design for testability ent://SD_ILS/0/SD_ILS:220153 2024-12-27T15:09:31Z 2024-12-27T15:09:31Z Yazar&#160;Fujiwara, Hideo.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fine line lithography ent://SD_ILS/0/SD_ILS:256117 2024-12-27T15:09:31Z 2024-12-27T15:09:31Z Yazar&#160;Newman, Roger.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444853516">http://www.sciencedirect.com/science/book/9780444853516</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>