Arama Sonuçları Kohler, Michael.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dKohler$00252C$002bMichael.$0026ic$003dtrue$0026ps$003d300?2024-12-02T15:43:13ZZählverfahren und Lastannahme in der Betriebsfestigkeitent://SD_ILS/0/SD_ILS:1922462024-12-02T15:43:13Z2024-12-02T15:43:13ZYazar Köhler, Michael. author. Jenne, Sven. author. Pötter, Kurt. author. Zenner, Harald. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-13164-6">http://dx.doi.org/10.1007/978-3-642-13164-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nanotechnologieent://SD_ILS/0/SD_ILS:3005642024-12-02T15:43:13Z2024-12-02T15:43:13ZYazar Köhler, J. M. (J. Michael), 1956- Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/3527603301">http://dx.doi.org/10.1002/3527603301</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nanotechnology an introduction to nanostructuring techniquesent://SD_ILS/0/SD_ILS:3035932024-12-02T15:43:13Z2024-12-02T15:43:13ZYazar Köhler, J. M. (J. Michael), 1956- Fritzsche, Wolfgang, Dr.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9783527621132">http://dx.doi.org/10.1002/9783527621132</a>
<a href="http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=9783527621132">http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=9783527621132</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=481612">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=481612</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Etching in microsystem technologyent://SD_ILS/0/SD_ILS:3006982024-12-02T15:43:13Z2024-12-02T15:43:13ZYazar Köhler, J. M. (J. Michael), 1956- Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9783527613786">http://dx.doi.org/10.1002/9783527613786</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Ätzverfahren für die Mikrotechnikent://SD_ILS/0/SD_ILS:3005332024-12-02T15:43:13Z2024-12-02T15:43:13ZYazar Köhler, J. M. (J. Michael), 1956- John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/3527602917">http://dx.doi.org/10.1002/3527602917</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Chancen und Grenzen von Wirkungsorientierung in den Hilfen zur Erziehungent://SD_ILS/0/SD_ILS:2030272024-12-02T15:43:13Z2024-12-02T15:43:13ZYazar Frey, Franz. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-8350-5542-1">http://dx.doi.org/10.1007/978-3-8350-5542-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Eine Einführung in die Statistik und ihre Anwendungenent://SD_ILS/0/SD_ILS:1929012024-12-02T15:43:13Z2024-12-02T15:43:13ZYazar Eckle-Kohler, Judith. author. Kohler, Michael. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-15226-9">http://dx.doi.org/10.1007/978-3-642-15226-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Eine Einführung in die Statistik und ihre Anwendungenent://SD_ILS/0/SD_ILS:1896982024-12-02T15:43:13Z2024-12-02T15:43:13ZYazar Eckle-Kohler, Judith. author. Kohler, Michael. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-00471-1">http://dx.doi.org/10.1007/978-3-642-00471-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Recent Developments in Applied Probability and Statistics Dedicated to the Memory of Jürgen Lehnent://SD_ILS/0/SD_ILS:1984832024-12-02T15:43:13Z2024-12-02T15:43:13ZYazar Devroye, Luc. editor. Karasözen, Bülent. editor. Kohler, Michael. editor. Korn, Ralf. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-7908-2598-5">http://dx.doi.org/10.1007/978-3-7908-2598-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nanotechnology an introduction to nanostructuring techniquesent://SD_ILS/0/SD_ILS:3022552024-12-02T15:43:13Z2024-12-02T15:43:13ZYazar Köhler, M. Köhler, J. M. (J. Michael), 1956- Fritzsche, Wolfgang, Dr.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9783527612369">http://dx.doi.org/10.1002/9783527612369</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Umweltdiagnostik mit Mikrosystemenent://SD_ILS/0/SD_ILS:3006192024-12-02T15:43:13Z2024-12-02T15:43:13ZYazar Henze, Günter. Köhler, J. M. (J. Michael), 1956- Lay, J. P. (Jan Peter) Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9783527610587">http://dx.doi.org/10.1002/9783527610587</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>