Arama Sonuçları Large scale systems. - Daraltılmış: 2007SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dLarge$002bscale$002bsystems.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092007$0025092007$0026ps$003d300$0026isd$003dtrue?dt=list2024-11-23T02:55:09ZVlsi-Soc: From Systems To Silicon Proceedings of IFIP TC 10, WG 10.5, Thirteenth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2005), October 17-19, 2005, Perth, Australiaent://SD_ILS/0/SD_ILS:1670752024-11-23T02:55:09Z2024-11-23T02:55:09ZYazar Reis, Ricardo. editor. Osseiran, Adam. editor. Pfleiderer, Hans-Joerg. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-73661-7">http://dx.doi.org/10.1007/978-0-387-73661-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Sensitivity and uncertainty analysisent://SD_ILS/0/SD_ILS:2863942024-11-23T02:55:09Z2024-11-23T02:55:09ZYazar Cacuci, D. G. Ionescu-Bujor, Mihaela. Navon, Ionel Michael.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203483572">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Sensitivity and uncertainty analysisent://SD_ILS/0/SD_ILS:2873342024-11-23T02:55:09Z2024-11-23T02:55:09ZYazar Cacuci, D. G. Ionescu-Bujor, Mihaela. Navon, Ionel Michael.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203498798">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>