Arama Sonuçları Liou, Juin J.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dLiou$00252C$002bJuin$002bJ.$0026ps$003d300?
2026-05-17T19:51:16Z
Semiconductor process reliability in practice
ent://SD_ILS/0/SD_ILS:293479
2026-05-17T19:51:16Z
2026-05-17T19:51:16Z
Yazar Gan, Zhenghao. Wong, Waisum. Liou, Juin J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/semiconductor-process-reliability-in-practice">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
ent://SD_ILS/0/SD_ILS:530152
2026-05-17T19:51:16Z
2026-05-17T19:51:16Z
Yazar Cui, Qiang. author. Liou, Juin J. author. Hajjar, Jean-Jacques. author. Salcedo, Javier. author. Zhou, Yuanzhong. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-10819-3">https://doi.org/10.1007/978-3-319-10819-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>