Arama Sonuçları Logic circuits -- Testing.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dLogic$002bcircuits$002b--$002bTesting.$0026ic$003dtrue$0026ps$003d300?dt=list2025-12-07T13:59:02ZFormal Modeling and Analysis of Timed Systems 21st International Conference, FORMATS 2023, Antwerp, Belgium, September 19-21, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5210822025-12-07T13:59:02Z2025-12-07T13:59:02ZYazar Petrucci, Laure. editor. Sproston, Jeremy. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-42626-1">https://doi.org/10.1007/978-3-031-42626-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Emerging Computing: From Devices to Systems Looking Beyond Moore and Von Neumannent://SD_ILS/0/SD_ILS:5273842025-12-07T13:59:02Z2025-12-07T13:59:02ZYazar Aly, Mohamed M. Sabry. editor. Chattopadhyay, Anupam. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-16-7487-7">https://doi.org/10.1007/978-981-16-7487-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Digital design and fabricationent://SD_ILS/0/SD_ILS:5405042025-12-07T13:59:02Z2025-12-07T13:59:02ZYazar Oklobdzija, Vojin G.<br/>Yer Numarası TK7885 .D54 2008<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315222226">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>The VLSI handbookent://SD_ILS/0/SD_ILS:5475042025-12-07T13:59:02Z2025-12-07T13:59:02ZYazar Chen, Wai-Kai, 1936-<br/>Yer Numarası TK7874.75 .V573 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420005967">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Microelectronicsent://SD_ILS/0/SD_ILS:5474892025-12-07T13:59:02Z2025-12-07T13:59:02ZYazar Whitaker, Jerry C.<br/>Yer Numarası TK7874 .M4587 2006<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420037593">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Computers, Software Engineering, and Digital Devicesent://SD_ILS/0/SD_ILS:5424932025-12-07T13:59:02Z2025-12-07T13:59:02ZYazar Dorf, Richard C., author. Taylor and Francis.<br/>Yer Numarası TK7885<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420037050">Click here to view.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Logic testing and design for testabilityent://SD_ILS/0/SD_ILS:2201532025-12-07T13:59:02Z2025-12-07T13:59:02ZYazar Fujiwara, Hideo.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>