Arama Sonuçları Logic circuits -- Testing. - Daraltılmış: English
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dLogic$002bcircuits$002b--$002bTesting.$0026qf$003dLANGUAGE$002509Dil$002509ENG$002509English$0026ic$003dtrue$0026ps$003d300?
2024-12-12T06:10:40Z
Formal Modeling and Analysis of Timed Systems 21st International Conference, FORMATS 2023, Antwerp, Belgium, September 19-21, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521082
2024-12-12T06:10:40Z
2024-12-12T06:10:40Z
Yazar Petrucci, Laure. editor. Sproston, Jeremy. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521082.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-42626-1">https://doi.org/10.1007/978-3-031-42626-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The VLSI handbook
ent://SD_ILS/0/SD_ILS:289331
2024-12-12T06:10:40Z
2024-12-12T06:10:40Z
Yazar Chen, Wai-Kai, 1936-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420005967">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Logic testing and design for testability
ent://SD_ILS/0/SD_ILS:220153
2024-12-12T06:10:40Z
2024-12-12T06:10:40Z
Yazar Fujiwara, Hideo.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>