Arama Sonuçları Logic circuits -- Testing. - Daraltılmış: CRC EkitaplarıSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dLogic$002bcircuits$002b--$002bTesting.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253ACRCEBOOKS$002509CRC$002bEkitaplar$0025C4$0025B1$0026ps$003d300?2025-12-09T22:35:04ZDigital design and fabricationent://SD_ILS/0/SD_ILS:5405042025-12-09T22:35:04Z2025-12-09T22:35:04ZYazar Oklobdzija, Vojin G.<br/>Yer Numarası TK7885 .D54 2008<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315222226">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>The VLSI handbookent://SD_ILS/0/SD_ILS:5475042025-12-09T22:35:04Z2025-12-09T22:35:04ZYazar Chen, Wai-Kai, 1936-<br/>Yer Numarası TK7874.75 .V573 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420005967">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Microelectronicsent://SD_ILS/0/SD_ILS:5474892025-12-09T22:35:04Z2025-12-09T22:35:04ZYazar Whitaker, Jerry C.<br/>Yer Numarası TK7874 .M4587 2006<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420037593">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Computers, Software Engineering, and Digital Devicesent://SD_ILS/0/SD_ILS:5424932025-12-09T22:35:04Z2025-12-09T22:35:04ZYazar Dorf, Richard C., author. Taylor and Francis.<br/>Yer Numarası TK7885<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420037050">Click here to view.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>