Arama Sonuçları Logic circuits -- Testing. - Daraltılmış: Elektronik Kütüphane
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dLogic$002bcircuits$002b--$002bTesting.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Elektronik$002bK$0025C3$0025BCt$0025C3$0025BCphane$0026ps$003d300?
2025-12-14T00:36:17Z
Emerging Computing: From Devices to Systems Looking Beyond Moore and Von Neumann
ent://SD_ILS/0/SD_ILS:527384
2025-12-14T00:36:17Z
2025-12-14T00:36:17Z
Yazar Aly, Mohamed M. Sabry. editor. Chattopadhyay, Anupam. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-16-7487-7">https://doi.org/10.1007/978-981-16-7487-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Formal Modeling and Analysis of Timed Systems 21st International Conference, FORMATS 2023, Antwerp, Belgium, September 19-21, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521082
2025-12-14T00:36:17Z
2025-12-14T00:36:17Z
Yazar Petrucci, Laure. editor. Sproston, Jeremy. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-42626-1">https://doi.org/10.1007/978-3-031-42626-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Logic testing and design for testability
ent://SD_ILS/0/SD_ILS:220153
2025-12-14T00:36:17Z
2025-12-14T00:36:17Z
Yazar Fujiwara, Hideo.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>