Arama Sonuçları Map engineering - Daraltılmış: EnglishSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMap$002bengineering$0026qf$003dLANGUAGE$002509Dil$002509ENG$002509English$0026ps$003d300?2024-11-17T15:58:40ZAnalysis of Engineering Drawings and Raster Map Imagesent://SD_ILS/0/SD_ILS:4886802024-11-17T15:58:40Z2024-11-17T15:58:40ZYazar Henderson, Thomas C. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4419-8167-7">https://doi.org/10.1007/978-1-4419-8167-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software engineering standards : a user's road mapent://SD_ILS/0/SD_ILS:965942024-11-17T15:58:40Z2024-11-17T15:58:40ZYazar Moore, James W., 1948-<br/>Yer Numarası QA 76.758 M66 1998<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~2<br/>Product Lifecycle Management. PLM in Transition Times: The Place of Humans and Transformative Technologies 19th IFIP WG 5.1 International Conference, PLM 2022, Grenoble, France, July 10-13, 2022, Revised Selected Papersent://SD_ILS/0/SD_ILS:5205582024-11-17T15:58:40Z2024-11-17T15:58:40ZYazar Noël, Frédéric. editor. Nyffenegger, Felix. editor. (orcid) Rivest, Louis. editor. Bouras, Abdelaziz. editor. (orcid) SpringerLink (Online service)<br/>Yer Numarası XX(520558.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-25182-5">https://doi.org/10.1007/978-3-031-25182-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer Science and Education 17th International Conference, ICCSE 2022, Ningbo, China, August 18-21, 2022, Revised Selected Papers, Part IIIent://SD_ILS/0/SD_ILS:5202462024-11-17T15:58:40Z2024-11-17T15:58:40ZYazar Hong, Wenxing. editor. Weng, Yang. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520246.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-2449-3">https://doi.org/10.1007/978-981-99-2449-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Educational Data Science: Essentials, Approaches, and Tendencies Proactive Education based on Empirical Big Data Evidenceent://SD_ILS/0/SD_ILS:5202292024-11-17T15:58:40Z2024-11-17T15:58:40ZYazar Peña-Ayala, Alejandro. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520229.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-0026-8">https://doi.org/10.1007/978-981-99-0026-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Enterprise, Business-Process and Information Systems Modeling 24th International Conference, BPMDS 2023, and 28th International Conference, EMMSAD 2023, Zaragoza, Spain, June 12-13, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5204212024-11-17T15:58:40Z2024-11-17T15:58:40ZYazar van der Aa, Han. editor. Bork, Dominik. editor. (orcid) Proper, Henderik A. editor. Schmidt, Rainer. editor. (orcid) SpringerLink (Online service)<br/>Yer Numarası XX(520421.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-34241-7">https://doi.org/10.1007/978-3-031-34241-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Human-Computer Interaction - INTERACT 2023 19th IFIP TC13 International Conference, York, UK, August 28 - September 1, 2023, Proceedings, Part IVent://SD_ILS/0/SD_ILS:5209732024-11-17T15:58:40Z2024-11-17T15:58:40ZYazar Abdelnour Nocera, José. editor. Kristín Lárusdóttir, Marta. editor. Petrie, Helen. editor. Piccinno, Antonio. editor. Winckler, Marco. editor.<br/>Yer Numarası XX(520973.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-42293-5">https://doi.org/10.1007/978-3-031-42293-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Swarm Intelligence 14th International Conference, ICSI 2023, Shenzhen, China, July 14-18, 2023, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5210232024-11-17T15:58:40Z2024-11-17T15:58:40ZYazar Tan, Ying. editor. Shi, Yuhui. editor. Luo, Wenjian. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521023.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36622-2">https://doi.org/10.1007/978-3-031-36622-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Swarm Intelligence 14th International Conference, ICSI 2023, Shenzhen, China, July 14-18, 2023, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5210242024-11-17T15:58:40Z2024-11-17T15:58:40ZYazar Tan, Ying. editor. Shi, Yuhui. editor. Luo, Wenjian. editor. SpringerLink (Online service)<br/>Yer Numarası XX(521024.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36625-3">https://doi.org/10.1007/978-3-031-36625-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Information Systems Engineering in Complex Environments CAiSE Forum 2014, Thessaloniki, Greece, June 16-20, 2014, Selected Extended Papersent://SD_ILS/0/SD_ILS:5185552024-11-17T15:58:40Z2024-11-17T15:58:40ZYazar Nurcan, Selmin. editor. Pimenidis, Elias. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518555.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-19270-3">https://doi.org/10.1007/978-3-319-19270-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Modified atmosphere and active packaging technologiesent://SD_ILS/0/SD_ILS:2861472024-11-17T15:58:40Z2024-11-17T15:58:40ZYazar Arvanitoyannis, Ioannis.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439800454">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>In-situ rock stress measurement, interpretation and application : proceedings of the International Symposium on In-Situ Rock Stress, Trondheim, Norway,19-21 June 2006ent://SD_ILS/0/SD_ILS:2879212024-11-17T15:58:40Z2024-11-17T15:58:40ZYazar International Symposium on In-situ Rock Stress (2006 : Trondheim, Norway) Lu, Ming.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439833650">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>