Arama Sonuçları Materials -- Defects.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMaterials$002b--$002bDefects.$0026ps$003d300?2025-03-14T00:13:17ZMaterials processing defectsent://SD_ILS/0/SD_ILS:2544382025-03-14T00:13:17Z2025-03-14T00:13:17ZYazar Ghosh, S. K. (Swadhin Kumar) Predeleanu, M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444817068">http://www.sciencedirect.com/science/book/9780444817068</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advanced methods in materials processing defectsent://SD_ILS/0/SD_ILS:2544412025-03-14T00:13:17Z2025-03-14T00:13:17ZYazar Predeleanu, M. Gilormini, P. International Conference on Materials Processing Defects (3rd : 1997 : Cachan, France)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444826701">http://www.sciencedirect.com/science/book/9780444826701</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Defects in microelectronic materials and devicesent://SD_ILS/0/SD_ILS:2860102025-03-14T00:13:17Z2025-03-14T00:13:17ZYazar Fleetwood, Daniel. Pantelides, Sokrates T. Schrimpf, Ronald Donald.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420043778">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Elements of structures and defects of crystalline materialsent://SD_ILS/0/SD_ILS:4599712025-03-14T00:13:17Z2025-03-14T00:13:17ZYazar Fang, Tsang-Tse, 1955- author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128142684">https://www.sciencedirect.com/science/book/9780128142684</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128142684">http://www.sciencedirect.com/science/book/9780128142684</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Defects in Advanced Electronic Materials and Novel Low Dimensional Structuresent://SD_ILS/0/SD_ILS:4601762025-03-14T00:13:17Z2025-03-14T00:13:17ZYazar Chen, Weimin, editor. Stehr, Jan, editor. Buyanova, Irina, editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780081020531">https://www.sciencedirect.com/science/book/9780081020531</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Voids in materials : from unavoidable defects to designed cellular materialsent://SD_ILS/0/SD_ILS:3555242025-03-14T00:13:17Z2025-03-14T00:13:17ZYazar Gladysz, Gary M., author.<br/>Yer Numarası ONLINE(355524.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444563675">http://www.sciencedirect.com/science/book/9780444563675</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Defects and damage in composite materials and structuresent://SD_ILS/0/SD_ILS:3570932025-03-14T00:13:17Z2025-03-14T00:13:17ZYazar Heslehurst, Rikard Benton, author.<br/>Yer Numarası ONLINE(357093.1)<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781466580480">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advanced calculations for defects in materials : electronic structure methodsent://SD_ILS/0/SD_ILS:2695972025-03-14T00:13:17Z2025-03-14T00:13:17ZYazar Alkauskas, Audrius.<br/>Yer Numarası TA410 A379 2011<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>High-Z Materials for X-ray Detection Material Properties and Characterization Techniquesent://SD_ILS/0/SD_ILS:5269112025-03-14T00:13:17Z2025-03-14T00:13:17ZYazar Abbene, Leonardo. editor. Iniewski, Krzysztof (Kris). editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-20955-0">https://doi.org/10.1007/978-3-031-20955-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Additive Manufacturing Materials, Functionalities and Applicationsent://SD_ILS/0/SD_ILS:5269962025-03-14T00:13:17Z2025-03-14T00:13:17ZYazar Zhou, Kun. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-04721-3">https://doi.org/10.1007/978-3-031-04721-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Atlas of Finger Reconstruction Techniques and Casesent://SD_ILS/0/SD_ILS:5214762025-03-14T00:13:17Z2025-03-14T00:13:17ZYazar Lin, Jian. author. Wang, Jianli. author. Hu, Deqing. author. Xu, Yongqing. author. Zhang, Tianhao. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-9612-2">https://doi.org/10.1007/978-981-19-9612-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nanoscience with Liquid Crystals From Self-Organized Nanostructures to Applicationsent://SD_ILS/0/SD_ILS:5308602025-03-14T00:13:17Z2025-03-14T00:13:17ZYazar Li, Quan. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-04867-3">https://doi.org/10.1007/978-3-319-04867-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in thin-film solar cellsent://SD_ILS/0/SD_ILS:2854172025-03-14T00:13:17Z2025-03-14T00:13:17ZYazar Dharmadasa, I. M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9789814364126">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nanomanufacturing handbookent://SD_ILS/0/SD_ILS:2902752025-03-14T00:13:17Z2025-03-14T00:13:17ZYazar Busnaina, A. A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420004922">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Investigation of aeronautical and engineering component failuresent://SD_ILS/0/SD_ILS:2882812025-03-14T00:13:17Z2025-03-14T00:13:17ZYazar Reddy, A. Venugopal.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203492093">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Laser-induced damage of optical materialsent://SD_ILS/0/SD_ILS:2859192025-03-14T00:13:17Z2025-03-14T00:13:17ZYazar Wood, Roger M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420034059">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2ent://SD_ILS/0/SD_ILS:2562772025-03-14T00:13:17Z2025-03-14T00:13:17ZYazar International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan) Sumino, K. (Kōji), 1931-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444884299">http://www.sciencedirect.com/science/book/9780444884299</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Irradiation effects in fissile materialsent://SD_ILS/0/SD_ILS:408182025-03-14T00:13:17Z2025-03-14T00:13:17ZYazar Leteurtre, J. Quere, Y., ort. yaz.<br/>Yer Numarası QD 901 D4 1972 C6<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>