Arama Sonu&ccedil;lar&#305; Materials -- Defects. - Daralt&#305;lm&#305;&#351;: Elektronik K&uuml;t&uuml;phane SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMaterials$002b--$002bDefects.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Elektronik$002bK$0025C3$0025BCt$0025C3$0025BCphane$0026ps$003d300?dt=list 2024-11-29T15:33:54Z Materials processing defects ent://SD_ILS/0/SD_ILS:254438 2024-11-29T15:33:54Z 2024-11-29T15:33:54Z Yazar&#160;Ghosh, S. K. (Swadhin Kumar)&#160;Predeleanu, M.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444817068">http://www.sciencedirect.com/science/book/9780444817068</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advanced methods in materials processing defects ent://SD_ILS/0/SD_ILS:254441 2024-11-29T15:33:54Z 2024-11-29T15:33:54Z Yazar&#160;Predeleanu, M.&#160;Gilormini, P.&#160;International Conference on Materials Processing Defects (3rd : 1997 : Cachan, France)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444826701">http://www.sciencedirect.com/science/book/9780444826701</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Defects in microelectronic materials and devices ent://SD_ILS/0/SD_ILS:286010 2024-11-29T15:33:54Z 2024-11-29T15:33:54Z Yazar&#160;Fleetwood, Daniel.&#160;Pantelides, Sokrates T.&#160;Schrimpf, Ronald Donald.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420043778">Distributed by publisher. 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Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Laser-induced damage of optical materials ent://SD_ILS/0/SD_ILS:285919 2024-11-29T15:33:54Z 2024-11-29T15:33:54Z Yazar&#160;Wood, Roger M.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420034059">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2 ent://SD_ILS/0/SD_ILS:256277 2024-11-29T15:33:54Z 2024-11-29T15:33:54Z Yazar&#160;International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan)&#160;Sumino, K. (K&#333;ji), 1931-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444884299">http://www.sciencedirect.com/science/book/9780444884299</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>