Arama Sonuçları Materials -- Defects.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMaterials$002b--$002bDefects.$0026ps$003d300$0026isd$003dtrue?dt=list2026-01-13T13:58:38ZMaterials processing defectsent://SD_ILS/0/SD_ILS:2544382026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Ghosh, S. K. (Swadhin Kumar) Predeleanu, M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444817068">http://www.sciencedirect.com/science/book/9780444817068</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advanced methods in materials processing defectsent://SD_ILS/0/SD_ILS:2544412026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Predeleanu, M. Gilormini, P. International Conference on Materials Processing Defects (3rd : 1997 : Cachan, France)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444826701">http://www.sciencedirect.com/science/book/9780444826701</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Defects in microelectronic materials and devicesent://SD_ILS/0/SD_ILS:5431962026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Fleetwood, D. M. (Dan M.) Pantelides, Sokrates T. Schrimpf, Ronald Donald.<br/>Yer Numarası TK7871 .D44 2009<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420043778">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Uncertainty quantification of stochastic defects in materialsent://SD_ILS/0/SD_ILS:5597902026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Chu, Liu (Materials scientist), author.<br/>Yer Numarası TA404.23<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003226628">https://www.taylorfrancis.com/books/9781003226628</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>FAILURE ANALYSIS OF COMPOSITE MATERIALS WITH MANUFACTURING DEFECTSent://SD_ILS/0/SD_ILS:5780512026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Talreja, R.<br/>Yer Numarası TA418.9 .C6<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003225737">https://www.taylorfrancis.com/books/9781003225737</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Elements of structures and defects of crystalline materialsent://SD_ILS/0/SD_ILS:4599712026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Fang, Tsang-Tse, 1955- author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128142684">https://www.sciencedirect.com/science/book/9780128142684</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128142684">http://www.sciencedirect.com/science/book/9780128142684</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Defects in Advanced Electronic Materials and Novel Low Dimensional Structuresent://SD_ILS/0/SD_ILS:4601762026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Chen, Weimin, editor. Stehr, Jan, editor. Buyanova, Irina, editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780081020531">https://www.sciencedirect.com/science/book/9780081020531</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Voids in materials : from unavoidable defects to designed cellular materialsent://SD_ILS/0/SD_ILS:3555242026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Gladysz, Gary M., author.<br/>Yer Numarası ONLINE(355524.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444563675">http://www.sciencedirect.com/science/book/9780444563675</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Defects and damage in composite materials and structuresent://SD_ILS/0/SD_ILS:5411932026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Heslehurst, Rikard Benton, author.<br/>Yer Numarası TA418.9 .C6 H48 2014<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781466580480">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Advanced calculations for defects in materials : electronic structure methodsent://SD_ILS/0/SD_ILS:2695972026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Alkauskas, Audrius.<br/>Yer Numarası TA410 A379 2011<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Defect passivation and doping engineering for highly efficient perovskite solar cellsent://SD_ILS/0/SD_ILS:5901472026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Li, Meicheng, editor.<br/>Yer Numarası TK2963 .P47<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032614182">https://www.taylorfrancis.com/books/9781032614182</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Atlas of Finger Reconstruction Techniques and Casesent://SD_ILS/0/SD_ILS:5214762026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Lin, Jian. author. Wang, Jianli. author. Hu, Deqing. author. Xu, Yongqing. author. Zhang, Tianhao. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-9612-2">https://doi.org/10.1007/978-981-19-9612-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High-Z Materials for X-ray Detection Material Properties and Characterization Techniquesent://SD_ILS/0/SD_ILS:5269112026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Abbene, Leonardo. editor. Iniewski, Krzysztof (Kris). editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-20955-0">https://doi.org/10.1007/978-3-031-20955-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Additive Manufacturing Materials, Functionalities and Applicationsent://SD_ILS/0/SD_ILS:5269962026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Zhou, Kun. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-04721-3">https://doi.org/10.1007/978-3-031-04721-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Silicon, germanium, and their alloys : growth, defects, impurities, and nanocrystalsent://SD_ILS/0/SD_ILS:5457492026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Kissinger, Gudrun, editor. Pizzini, Sergio, editor.<br/>Yer Numarası TA480 .G4 S545 2015<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781466586659">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Nanoscience with Liquid Crystals From Self-Organized Nanostructures to Applicationsent://SD_ILS/0/SD_ILS:5308602026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Li, Quan. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-04867-3">https://doi.org/10.1007/978-3-319-04867-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in thin-film solar cellsent://SD_ILS/0/SD_ILS:5457982026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Dharmadasa, I. M., author.<br/>Yer Numarası TK2960 .D43 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9789814364126">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Oxide nanostructures : growth, microstructures, and propertiesent://SD_ILS/0/SD_ILS:5446402026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Srivastava, Avanish Kumar, editor.<br/>Yer Numarası QD381 .O95 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9789814411363">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Nanomanufacturing handbookent://SD_ILS/0/SD_ILS:5424422026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Busnaina, A. A.<br/>Yer Numarası T174.7 .N36 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315213941">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Analytical characterization of aluminum, steel, and superalloysent://SD_ILS/0/SD_ILS:5389572026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar MacKenzie, D. Scott. Totten, George E.<br/>Yer Numarası TA480 .A6 A65 2006<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420030365">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Kinetics, transport, and structure in hard and soft materialsent://SD_ILS/0/SD_ILS:5398272026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Green, Peter F., author.<br/>Yer Numarası TA403 .G675 2005<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420027143">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>High-K gate dielectricsent://SD_ILS/0/SD_ILS:5466822026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Houssa, Michel.<br/>Yer Numarası TK7871.99 .M44 H49 2004<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420034141">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Investigation of aeronautical and engineering component failuresent://SD_ILS/0/SD_ILS:5392522026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Reddy, A. Venugopal., author.<br/>Yer Numarası TL672 .R44 2004<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781136968525">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Hernia infections : pathophysiology, diagnosis, treatment, preventionent://SD_ILS/0/SD_ILS:5379102026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Deysine, M Oaximo.<br/>Yer Numarası RD621 .H476 2004<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135523343">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Laser-induced damage of optical materialsent://SD_ILS/0/SD_ILS:5470072026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Wood, Roger M., author.<br/>Yer Numarası QC374 .W67 2003<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420034059">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Industrial applications of electron microscopyent://SD_ILS/0/SD_ILS:5393412026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Li, Zhigang R., 1958-<br/>Yer Numarası TA417.23 .I52 2003<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135551834">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Elastic waves in anisotropic laminatesent://SD_ILS/0/SD_ILS:5395622026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Liu, G. R. (Gui-Rong) Xi, Z. C.<br/>Yer Numarası TA418.9 .L3 L58 2002<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420040999">https://www.taylorfrancis.com/books/9781420040999</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367801793">https://www.taylorfrancis.com/books/9780367801793</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Repair, protection and waterproofing of concrete structuresent://SD_ILS/0/SD_ILS:5432272026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Perkins, Philip Harold., author.<br/>Yer Numarası TA681 .P47 1997<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135820428">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2ent://SD_ILS/0/SD_ILS:2562772026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan) Sumino, K. (Kōji), 1931-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444884299">http://www.sciencedirect.com/science/book/9780444884299</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Irradiation effects in fissile materialsent://SD_ILS/0/SD_ILS:408182026-01-13T13:58:38Z2026-01-13T13:58:38ZYazar Leteurtre, J. Quere, Y., ort. yaz.<br/>Yer Numarası QD 901 D4 1972 C6<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>