Arama Sonu&ccedil;lar&#305; Materials -- Microscopy. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMaterials$002b--$002bMicroscopy.$0026ps$003d300? 2024-11-13T20:20:21Z Microscopy of Semiconducting Materials 2007 ent://SD_ILS/0/SD_ILS:170247 2024-11-13T20:20:21Z 2024-11-13T20:20:21Z Yazar&#160;Cullis, A. G. editor.&#160;Midgley, P. A. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-8615-1">http://dx.doi.org/10.1007/978-1-4020-8615-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Transmission Electron Microscopy and Diffractometry of Materials ent://SD_ILS/0/SD_ILS:333265 2024-11-13T20:20:21Z 2024-11-13T20:20:21Z Yazar&#160;Fultz, Brent. author.&#160;Howe, James. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(333265.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-29761-8">http://dx.doi.org/10.1007/978-3-642-29761-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Transmission Electron Microscopy and Diffractometry of Materials ent://SD_ILS/0/SD_ILS:186997 2024-11-13T20:20:21Z 2024-11-13T20:20:21Z Yazar&#160;Fultz, Brent. author.&#160;Howe, James M. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-73886-2">http://dx.doi.org/10.1007/978-3-540-73886-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Electron microscopy and structure of materials : proceedings ent://SD_ILS/0/SD_ILS:47176 2024-11-13T20:20:21Z 2024-11-13T20:20:21Z Yazar&#160;International Materials Symposium (5th : 1971 : University of California, Berkeley)&#160;Thomas, Gareth. , ed.&#160;Fulrath, Richard M. , ed.&#160;Fisher, Robert M., ed.&#160;University Conference on Ceramic Science (7th : 1971 : Berkeley)<br/>Yer Numaras&#305;&#160;TA 407 I65 1972<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopy ent://SD_ILS/0/SD_ILS:172791 2024-11-13T20:20:21Z 2024-11-13T20:20:21Z Yazar&#160;Kalinin, Sergei V. editor.&#160;Gruverman, Alexei. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-7167-8">http://dx.doi.org/10.1007/978-1-4419-7167-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Transmission Electron Microscopy A Textbook for Materials Science ent://SD_ILS/0/SD_ILS:167351 2024-11-13T20:20:21Z 2024-11-13T20:20:21Z Yazar&#160;Williams, David B. author.&#160;Carter, C. Barry. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-76501-3">http://dx.doi.org/10.1007/978-0-387-76501-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> EMC 2008 14th European Microscopy Congress 1&ndash;5 September 2008, Aachen, Germany Volume 2: Materials Science ent://SD_ILS/0/SD_ILS:188643 2024-11-13T20:20:21Z 2024-11-13T20:20:21Z Yazar&#160;Richter, Silvia. editor.&#160;Schwedt, Alexander. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85226-1">http://dx.doi.org/10.1007/978-3-540-85226-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1&ndash;13 October 2002 ent://SD_ILS/0/SD_ILS:168790 2024-11-13T20:20:21Z 2024-11-13T20:20:21Z Yazar&#160;Vilarinho, Paula Maria. editor.&#160;Rosenwaks, Yossi. editor.&#160;Kingon, Angus. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-4020-3019-3">http://dx.doi.org/10.1007/1-4020-3019-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11&ndash;14, 2005, Oxford, UK ent://SD_ILS/0/SD_ILS:182995 2024-11-13T20:20:21Z 2024-11-13T20:20:21Z Yazar&#160;Cullis, A. 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(Severin)&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527620753">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of microscopy applications in materials science, solid-state physics, and chemistry ent://SD_ILS/0/SD_ILS:300844 2024-11-13T20:20:21Z 2024-11-13T20:20:21Z Yazar&#160;Amelinckx, S. (Severin)&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9783527619283">http://dx.doi.org/10.1002/9783527619283</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Electron microscopy in plasticity and fracture research of materials : proceedings of the international symposium held at Holzhau near Dresden, 8 to 13 October 1989 ent://SD_ILS/0/SD_ILS:72579 2024-11-13T20:20:21Z 2024-11-13T20:20:21Z Yazar&#160;Messerschmidt, U. , ed.<br/>Yer Numaras&#305;&#160;TA 417.35 E43 1990<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Scanning electron microscopy : applications to materials and device science ent://SD_ILS/0/SD_ILS:54246 2024-11-13T20:20:21Z 2024-11-13T20:20:21Z Yazar&#160;Thornton, P. R.<br/>Yer Numaras&#305;&#160;QH 212.E4 T52 1968 1.K<br/>Format:&#160;Kitap<br/>Durum&#160;Sa&#287;l&#305;k Bilimleri K&uuml;t&uuml;phanesi~1<br/> Electron microscopy in heterogeneous catalysis ent://SD_ILS/0/SD_ILS:291280 2024-11-13T20:20:21Z 2024-11-13T20:20:21Z Yazar&#160;Gai, Pratibha L., 1948-&#160;Boyes, E. D. (Edward D.)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420034417">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Characterization of radiation-damage by transmission electron microscopy ent://SD_ILS/0/SD_ILS:275395 2024-11-13T20:20:21Z 2024-11-13T20:20:21Z Yazar&#160;Jenkins, M. L., 1949-&#160;Kirk, M. A., 1942-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420034646">Distributed by publisher. 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C.&#160;Myhra, S. (Sverre), 1943-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420007800">Distributed by publisher. 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G.&#160;Kaplan, Wayne D.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://onlinelibrary.wiley.com/book/10.1002/9780470727133">Online text</a> <a href="http://onlinelibrary.wiley.com/book/10.1002/9780470727133">http://onlinelibrary.wiley.com/book/10.1002/9780470727133</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=470287">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=470287</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470727133">http://dx.doi.org/10.1002/9780470727133</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=234294&ref=toc">http://www.myilibrary.com?id=234294&ref=toc</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Carbon nanotubes properties and applications ent://SD_ILS/0/SD_ILS:284655 2024-11-13T20:20:21Z 2024-11-13T20:20:21Z Yazar&#160;O'Connell, Michael (Michael J.)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420004212">Distributed by publisher. 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(Channing C.)&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/3527605495">http://dx.doi.org/10.1002/3527605495</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Industrial applications of electron microscopy ent://SD_ILS/0/SD_ILS:285627 2024-11-13T20:20:21Z 2024-11-13T20:20:21Z Yazar&#160;Li, Zhigang R., 1958-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780203910306">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Nano and microstructural design of advanced materials a commemorative volume on Professor G. Thomas' seventieth birthday ent://SD_ILS/0/SD_ILS:256396 2024-11-13T20:20:21Z 2024-11-13T20:20:21Z Yazar&#160;Thomas, Gareth, 1932-&#160;Meyers, Marc A.&#160;Ritchie, R. O. (Robert O.)&#160;Sarikaya, Mehmet.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080443737">http://www.sciencedirect.com/science/book/9780080443737</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>