Arama Sonuçları Materials -- Microscopy.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMaterials$002b--$002bMicroscopy.$0026pe$003dd$00253A$0026ic$003dtrue$0026ps$003d300?2025-01-21T08:44:45ZMicroscopy of Semiconducting Materials 2007ent://SD_ILS/0/SD_ILS:1702472025-01-21T08:44:45Z2025-01-21T08:44:45ZYazar Cullis, A. G. editor. Midgley, P. A. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4020-8615-1">http://dx.doi.org/10.1007/978-1-4020-8615-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Transmission Electron Microscopy and Diffractometry of Materialsent://SD_ILS/0/SD_ILS:3332652025-01-21T08:44:45Z2025-01-21T08:44:45ZYazar Fultz, Brent. author. Howe, James. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333265.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-29761-8">http://dx.doi.org/10.1007/978-3-642-29761-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Transmission Electron Microscopy and Diffractometry of Materialsent://SD_ILS/0/SD_ILS:1869972025-01-21T08:44:45Z2025-01-21T08:44:45ZYazar Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-73886-2">http://dx.doi.org/10.1007/978-3-540-73886-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Electron microscopy and structure of materials : proceedingsent://SD_ILS/0/SD_ILS:471762025-01-21T08:44:45Z2025-01-21T08:44:45ZYazar International Materials Symposium (5th : 1971 : University of California, Berkeley) Thomas, Gareth. , ed. Fulrath, Richard M. , ed. Fisher, Robert M., ed. University Conference on Ceramic Science (7th : 1971 : Berkeley)<br/>Yer Numarası TA 407 I65 1972<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopyent://SD_ILS/0/SD_ILS:1727912025-01-21T08:44:45Z2025-01-21T08:44:45ZYazar Kalinin, Sergei V. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-7167-8">http://dx.doi.org/10.1007/978-1-4419-7167-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Transmission Electron Microscopy A Textbook for Materials Scienceent://SD_ILS/0/SD_ILS:1673512025-01-21T08:44:45Z2025-01-21T08:44:45ZYazar Williams, David B. author. Carter, C. 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(Severin) Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527620753">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Electron microscopy in plasticity and fracture research of materials : proceedings of the international symposium held at Holzhau near Dresden, 8 to 13 October 1989ent://SD_ILS/0/SD_ILS:725792025-01-21T08:44:45Z2025-01-21T08:44:45ZYazar Messerschmidt, U. , ed.<br/>Yer Numarası TA 417.35 E43 1990<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Scanning electron microscopy : applications to materials and device scienceent://SD_ILS/0/SD_ILS:542462025-01-21T08:44:45Z2025-01-21T08:44:45ZYazar Thornton, P. 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