Arama Sonuçları Materials -- Microscopy. - Daraltılmış: Physics.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMaterials$002b--$002bMicroscopy.$0026qf$003dSUBJECT$002509Konu$002509Physics.$002509Physics.$0026ps$003d300?dt=list
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Transmission Electron Microscopy and Diffractometry of Materials
ent://SD_ILS/0/SD_ILS:333265
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Yazar Fultz, Brent. author. Howe, James. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333265.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-29761-8">http://dx.doi.org/10.1007/978-3-642-29761-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany Volume 2: Materials Science
ent://SD_ILS/0/SD_ILS:188643
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Yazar Richter, Silvia. editor. Schwedt, Alexander. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-85226-1">http://dx.doi.org/10.1007/978-3-540-85226-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
ent://SD_ILS/0/SD_ILS:168790
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Yazar Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-3019-3">http://dx.doi.org/10.1007/1-4020-3019-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>