Arama Sonuçları Materials -- Microscopy.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMaterials$002b--$002bMicroscopy.$0026ps$003d300$0026isd$003dtrue?dt=list2024-11-22T21:36:11ZMicroscopy of Semiconducting Materials 2007ent://SD_ILS/0/SD_ILS:1702472024-11-22T21:36:11Z2024-11-22T21:36:11ZYazar Cullis, A. G. editor. Midgley, P. A. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4020-8615-1">http://dx.doi.org/10.1007/978-1-4020-8615-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Transmission Electron Microscopy and Diffractometry of Materialsent://SD_ILS/0/SD_ILS:3332652024-11-22T21:36:11Z2024-11-22T21:36:11ZYazar Fultz, Brent. author. Howe, James. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333265.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-29761-8">http://dx.doi.org/10.1007/978-3-642-29761-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Transmission Electron Microscopy and Diffractometry of Materialsent://SD_ILS/0/SD_ILS:1869972024-11-22T21:36:11Z2024-11-22T21:36:11ZYazar Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-73886-2">http://dx.doi.org/10.1007/978-3-540-73886-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Electron microscopy and structure of materials : proceedingsent://SD_ILS/0/SD_ILS:471762024-11-22T21:36:11Z2024-11-22T21:36:11ZYazar International Materials Symposium (5th : 1971 : University of California, Berkeley) Thomas, Gareth. , ed. Fulrath, Richard M. , ed. Fisher, Robert M., ed. University Conference on Ceramic Science (7th : 1971 : Berkeley)<br/>Yer Numarası TA 407 I65 1972<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopyent://SD_ILS/0/SD_ILS:1727912024-11-22T21:36:11Z2024-11-22T21:36:11ZYazar Kalinin, Sergei V. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-7167-8">http://dx.doi.org/10.1007/978-1-4419-7167-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Transmission Electron Microscopy A Textbook for Materials Scienceent://SD_ILS/0/SD_ILS:1673512024-11-22T21:36:11Z2024-11-22T21:36:11ZYazar Williams, David B. author. Carter, C. Barry. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-76501-3">http://dx.doi.org/10.1007/978-0-387-76501-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany Volume 2: Materials Scienceent://SD_ILS/0/SD_ILS:1886432024-11-22T21:36:11Z2024-11-22T21:36:11ZYazar Richter, Silvia. editor. Schwedt, Alexander. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-85226-1">http://dx.doi.org/10.1007/978-3-540-85226-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UKent://SD_ILS/0/SD_ILS:1829952024-11-22T21:36:11Z2024-11-22T21:36:11ZYazar Cullis, A. G. editor. Hutchison, J. L. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/3-540-31915-8">http://dx.doi.org/10.1007/3-540-31915-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002ent://SD_ILS/0/SD_ILS:1687902024-11-22T21:36:11Z2024-11-22T21:36:11ZYazar Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-3019-3">http://dx.doi.org/10.1007/1-4020-3019-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Characterization of High Tc Materials and Devices by Electron Microscopyent://SD_ILS/0/SD_ILS:2370972024-11-22T21:36:11Z2024-11-22T21:36:11ZYazar Browning, Nigel D.. Pennycook, Stephen J..<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1017/CBO9780511534829">Access by subscription</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of microscopy applications in materials science, solid-state physics, and chemistryent://SD_ILS/0/SD_ILS:3008442024-11-22T21:36:11Z2024-11-22T21:36:11ZYazar Amelinckx, S. (Severin) Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9783527619283">http://dx.doi.org/10.1002/9783527619283</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of microscopy applications in materials science, solid-state physics, and chemistryent://SD_ILS/0/SD_ILS:3008742024-11-22T21:36:11Z2024-11-22T21:36:11ZYazar Amelinckx, S. (Severin) Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527620524">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of microscopy applications in materials science, solid-state physics and chemistry. Methods Ient://SD_ILS/0/SD_ILS:3008782024-11-22T21:36:11Z2024-11-22T21:36:11ZYazar Amelinckx, S. 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(Severin) Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527620753">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Electron microscopy in plasticity and fracture research of materials : proceedings of the international symposium held at Holzhau near Dresden, 8 to 13 October 1989ent://SD_ILS/0/SD_ILS:725792024-11-22T21:36:11Z2024-11-22T21:36:11ZYazar Messerschmidt, U. , ed.<br/>Yer Numarası TA 417.35 E43 1990<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Scanning electron microscopy : applications to materials and device scienceent://SD_ILS/0/SD_ILS:542462024-11-22T21:36:11Z2024-11-22T21:36:11ZYazar Thornton, P. 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