Arama Sonu&ccedil;lar&#305; Materials -- Microscopy. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMaterials$002b--$002bMicroscopy.$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?dt=list 2026-01-19T15:09:24Z Microscopy of Semiconducting Materials 2007 ent://SD_ILS/0/SD_ILS:170247 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Cullis, A. G. editor.&#160;Midgley, P. A. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-8615-1">http://dx.doi.org/10.1007/978-1-4020-8615-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Transmission Electron Microscopy and Diffractometry of Materials ent://SD_ILS/0/SD_ILS:333265 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Fultz, Brent. author.&#160;Howe, James. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(333265.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-29761-8">http://dx.doi.org/10.1007/978-3-642-29761-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Transmission Electron Microscopy and Diffractometry of Materials ent://SD_ILS/0/SD_ILS:186997 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Fultz, Brent. author.&#160;Howe, James M. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-73886-2">http://dx.doi.org/10.1007/978-3-540-73886-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Electron microscopy and structure of materials : proceedings ent://SD_ILS/0/SD_ILS:47176 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;International Materials Symposium (5th : 1971 : University of California, Berkeley)&#160;Thomas, Gareth. , ed.&#160;Fulrath, Richard M. , ed.&#160;Fisher, Robert M., ed.&#160;University Conference on Ceramic Science (7th : 1971 : Berkeley)<br/>Yer Numaras&#305;&#160;TA 407 I65 1972<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Advanced microscopy : a strong analytical tool in materials science ent://SD_ILS/0/SD_ILS:574246 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Thomas, Merin Sara, editor.&#160;Haponiuk, J&oacute;zef T., editor.&#160;Thomas, Sabu, editor.&#160;George, Anne, 1961- editor.<br/>Yer Numaras&#305;&#160;QH207<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003282044">https://www.taylorfrancis.com/books/9781003282044</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists ent://SD_ILS/0/SD_ILS:560353 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Dong, ZhiLi, author.<br/>Yer Numaras&#305;&#160;QD131 .D66 2022<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429351662">https://www.taylorfrancis.com/books/9780429351662</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Scanning transmission electron microscopy : advanced characterization methods for materials science applications ent://SD_ILS/0/SD_ILS:565126 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Bruma, Alina, editor.<br/>Yer Numaras&#305;&#160;QH212 .S34 S33 2021<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429243011">https://www.taylorfrancis.com/books/9780429243011</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopy ent://SD_ILS/0/SD_ILS:172791 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Kalinin, Sergei V. editor.&#160;Gruverman, Alexei. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-7167-8">http://dx.doi.org/10.1007/978-1-4419-7167-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Transmission Electron Microscopy A Textbook for Materials Science ent://SD_ILS/0/SD_ILS:167351 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Williams, David B. author.&#160;Carter, C. Barry. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-387-76501-3">http://dx.doi.org/10.1007/978-0-387-76501-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> EMC 2008 14th European Microscopy Congress 1&ndash;5 September 2008, Aachen, Germany Volume 2: Materials Science ent://SD_ILS/0/SD_ILS:188643 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Richter, Silvia. editor.&#160;Schwedt, Alexander. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85226-1">http://dx.doi.org/10.1007/978-3-540-85226-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1&ndash;13 October 2002 ent://SD_ILS/0/SD_ILS:168790 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Vilarinho, Paula Maria. editor.&#160;Rosenwaks, Yossi. editor.&#160;Kingon, Angus. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/1-4020-3019-3">http://dx.doi.org/10.1007/1-4020-3019-3</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11&ndash;14, 2005, Oxford, UK ent://SD_ILS/0/SD_ILS:182995 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Cullis, A. G. editor.&#160;Hutchison, J. L. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/3-540-31915-8">http://dx.doi.org/10.1007/3-540-31915-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Characterization of High Tc Materials and Devices by Electron Microscopy ent://SD_ILS/0/SD_ILS:237097 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Browning, Nigel D..&#160;Pennycook, Stephen J..<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1017/CBO9780511534829">Access by subscription</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of microscopy applications in materials science, solid-state physics, and chemistry ent://SD_ILS/0/SD_ILS:300874 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Amelinckx, S. 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(Severin)&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9783527619283">http://dx.doi.org/10.1002/9783527619283</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Electron microscopy in plasticity and fracture research of materials : proceedings of the international symposium held at Holzhau near Dresden, 8 to 13 October 1989 ent://SD_ILS/0/SD_ILS:72579 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Messerschmidt, U. , ed.<br/>Yer Numaras&#305;&#160;TA 417.35 E43 1990<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Scanning electron microscopy : applications to materials and device science ent://SD_ILS/0/SD_ILS:54246 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Thornton, P. R.<br/>Yer Numaras&#305;&#160;QH 212.E4 T52 1968 1.K<br/>Format:&#160;Kitap<br/>Durum&#160;Sa&#287;l&#305;k Bilimleri K&uuml;t&uuml;phanesi~1<br/> Electron microscopy in heterogeneous catalysis ent://SD_ILS/0/SD_ILS:543039 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Gai, Pratibha L., 1948, author.&#160;Boyes, E. D. (Edward D.)<br/>Yer Numaras&#305;&#160;QD505 .G35 2003<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420034417">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Characterization of radiation-damage by transmission electron microscopy ent://SD_ILS/0/SD_ILS:544992 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Jenkins, M. L., 1949, author.&#160;Kirk, M. 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David N., author.<br/>Yer Numaras&#305;&#160;QC244 .C47 2012<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781315217307">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Aberration-corrected analytical transmission electron microscopy ent://SD_ILS/0/SD_ILS:318971 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Brydson, Rik, editor, author.<br/>Yer Numaras&#305;&#160;ONLINE(318971.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://lib.myilibrary.com?id=320457">Connect to MyiLibrary resource.</a> Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=693217">http://public.eblib.com/choice/publicfullrecord.aspx?p=693217</a> ebrary <a href="http://site.ebrary.com/id/10488537">http://site.ebrary.com/id/10488537</a> EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=509882">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=509882</a> John Wiley <a href="http://dx.doi.org/10.1002/9781119978848">http://dx.doi.org/10.1002/9781119978848</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Nanoscience Nanobiotechnology and Nanobiology ent://SD_ILS/0/SD_ILS:189091 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Boisseau, Patrick. editor.&#160;Houdy, Philippe. editor.&#160;Lahmani, Marcel. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-88633-4">http://dx.doi.org/10.1007/978-3-540-88633-4</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of nanophysics. Principles and methods ent://SD_ILS/0/SD_ILS:544191 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Sattler, Klaus D.<br/>Yer Numaras&#305;&#160;QC173.4 .M5 H358 2009<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420075410">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of cryo-preparation methods for electron microscopy ent://SD_ILS/0/SD_ILS:538549 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Cavalier, Annie.&#160;Spehner, Dani&egrave;le.&#160;Humbel, Bruno M.<br/>Yer Numaras&#305;&#160;QH324.9 .C7 H36 2009<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367800833">https://www.taylorfrancis.com/books/9780367800833</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of surface and interface analysis : methods for problem-solving ent://SD_ILS/0/SD_ILS:539878 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Riviere, J. C.&#160;Myhra, S. (Sverre), 1943-<br/>Yer Numaras&#305;&#160;QC173.4 .S94 H35 2009<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420007800">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Microstructural characterization of materials ent://SD_ILS/0/SD_ILS:302652 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Brandon, D. G.&#160;Kaplan, Wayne D.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://onlinelibrary.wiley.com/book/10.1002/9780470727133">Online text</a> <a href="http://onlinelibrary.wiley.com/book/10.1002/9780470727133">http://onlinelibrary.wiley.com/book/10.1002/9780470727133</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=470287">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=470287</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470727133">http://dx.doi.org/10.1002/9780470727133</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=234294&ref=toc">http://www.myilibrary.com?id=234294&ref=toc</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Current topics in elastomers research ent://SD_ILS/0/SD_ILS:543893 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Bhowmick, Anil K., 1954-<br/>Yer Numaras&#305;&#160;TS1925 .C87 2008<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420007183">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Multiphase polymer- based materials : an atlas of phase morphology at the nano and micro scale ent://SD_ILS/0/SD_ILS:540019 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Harrats, Charef., author.<br/>Yer Numaras&#305;&#160;QC173.4 .P65 H367 2008<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420062182">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Nanotechnology in biology and medicine : methods, devices, and applications ent://SD_ILS/0/SD_ILS:546895 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Vo-Dinh, Tuan.<br/>Yer Numaras&#305;&#160;R857 .N34 N36 2007<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420004441">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Analytical characterization of aluminum, steel, and superalloys ent://SD_ILS/0/SD_ILS:538957 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;MacKenzie, D. Scott.&#160;Totten, George E.<br/>Yer Numaras&#305;&#160;TA480 .A6 A65 2006<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420030365">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Carbon nanotubes : properties and applications ent://SD_ILS/0/SD_ILS:546504 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;O'Connell, Michael (Michael J.)<br/>Yer Numaras&#305;&#160;TA455 .C3 C374 2006<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781420004212">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Flocculation in natural and engineered environmental systems ent://SD_ILS/0/SD_ILS:541235 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Droppo, Ian G.<br/>Yer Numaras&#305;&#160;QD547 .F584 2005<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135463496">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Transmission electron energy loss spectrometry in materials science and the EELS atlas ent://SD_ILS/0/SD_ILS:302153 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Ahn, C. C. (Channing C.)&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/3527605495">http://dx.doi.org/10.1002/3527605495</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Electrostatics 2003 : proceedings of the Electrostatics Conference of the Institute of Physics : held in Edinburgh, UK, 23-27 March, 2003 ent://SD_ILS/0/SD_ILS:542550 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;International Conference on Electrostatics (2003 : Edinburgh, Scotland)&#160;Morgan, Hywel, 1960- editor.<br/>Yer Numaras&#305;&#160;QC570 .I59 2004 EB<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367801588">https://www.taylorfrancis.com/books/9780367801588</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mechanical tribology : materials, characterization, and applications ent://SD_ILS/0/SD_ILS:543356 2026-01-19T15:09:24Z 2026-01-19T15:09:24Z Yazar&#160;Totten, George E.&#160;Liang, Hong.<br/>Yer Numaras&#305;&#160;TJ1075 .M43 2004<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135540562">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Nano and microstructural design of advanced materials a commemorative volume on Professor G. 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L., 1945- author.&#160;CRC Press LLC.<br/>Yer Numaras&#305;&#160;QD381.9 .S97 I58 1996<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9789047414162">https://www.taylorfrancis.com/books/9789047414162</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9789047420057">https://www.taylorfrancis.com/books/9789047420057</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>