Arama Sonuçları McCall, James L., ed. - Daraltılmış: EnglishSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMcCall$00252C$002bJames$002bL.$00252C$002bed.$0026qf$003dLANGUAGE$002509Dil$002509ENG$002509English$0026ps$003d300?2024-11-11T07:06:22ZMetallographic specimen preparation : optical and electron microscopyent://SD_ILS/0/SD_ILS:177342024-11-11T07:06:22Z2024-11-11T07:06:22ZYazar McCall, James L., ed. Mueller William M., ed.<br/>Yer Numarası TN 690.7 M47 1974<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~2<br/>Microstructural analysis tools and techniquesent://SD_ILS/0/SD_ILS:612662024-11-11T07:06:22Z2024-11-11T07:06:22ZYazar McCall, James L., ed. Mueller, William, M., ed.<br/>Yer Numarası TN 689.2 M53 1973<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>