Arama Sonuçları McCall, James L., ed. - Daraltılmış: Beytepe KütüphanesiSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMcCall$00252C$002bJames$002bL.$00252C$002bed.$0026qf$003dLIBRARY$002509K$0025C3$0025BCt$0025C3$0025BCphane$0025091$00253ABEYTEPE$002509Beytepe$002bK$0025C3$0025BCt$0025C3$0025BCphanesi$0026ps$003d300?2024-11-11T07:37:03ZMetallographic specimen preparation : optical and electron microscopyent://SD_ILS/0/SD_ILS:177342024-11-11T07:37:03Z2024-11-11T07:37:03ZYazar McCall, James L., ed. Mueller William M., ed.<br/>Yer Numarası TN 690.7 M47 1974<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~2<br/>Microstructural analysis tools and techniquesent://SD_ILS/0/SD_ILS:612662024-11-11T07:37:03Z2024-11-11T07:37:03ZYazar McCall, James L., ed. Mueller, William, M., ed.<br/>Yer Numarası TN 689.2 M53 1973<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>