Arama Sonuçları Measurement - Daraltılmış: Nanotechnology.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMeasurement$0026qf$003dSUBJECT$002509Konu$002509Nanotechnology.$002509Nanotechnology.$0026ps$003d300?dt=list2024-11-22T12:06:28ZNanotechnology and Nanoelectronics Materials, Devices, Measurement Techniquesent://SD_ILS/0/SD_ILS:1808482024-11-22T12:06:28Z2024-11-22T12:06:28ZYazar Fahrner, W. R. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b137771">http://dx.doi.org/10.1007/b137771</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nanotribology and Nanomechanics I Measurement Techniques and Nanomechanicsent://SD_ILS/0/SD_ILS:1929202024-11-22T12:06:28Z2024-11-22T12:06:28ZYazar Bhushan, Bharat. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-15283-2">http://dx.doi.org/10.1007/978-3-642-15283-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Optical Measurement Techniques Innovations for Industry and the Life Sciencesent://SD_ILS/0/SD_ILS:1864022024-11-22T12:06:28Z2024-11-22T12:06:28ZYazar Peiponen, Kai-Erik. editor. Myllylä, Risto. editor. Priezzhev, Alexander V. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-71927-4">http://dx.doi.org/10.1007/978-3-540-71927-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Metrologyent://SD_ILS/0/SD_ILS:4853792024-11-22T12:06:28Z2024-11-22T12:06:28ZYazar Gao, Wei. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-4938-5">https://doi.org/10.1007/978-981-10-4938-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Ellipsometry at the Nanoscaleent://SD_ILS/0/SD_ILS:3337822024-11-22T12:06:28Z2024-11-22T12:06:28ZYazar Losurdo, Maria. editor. Hingerl, Kurt. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333782.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-33956-1">http://dx.doi.org/10.1007/978-3-642-33956-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Surface Science Techniquesent://SD_ILS/0/SD_ILS:3338192024-11-22T12:06:28Z2024-11-22T12:06:28ZYazar Bracco, Gianangelo. editor. Holst, Bodil. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333819.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-34243-1">http://dx.doi.org/10.1007/978-3-642-34243-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Micro- and nanoscale phenomena in tribologyent://SD_ILS/0/SD_ILS:2907732024-11-22T12:06:28Z2024-11-22T12:06:28ZYazar Chung, Yip-wah, 1950-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439839232">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Atomic nanoscale technology in the nuclear industryent://SD_ILS/0/SD_ILS:2898942024-11-22T12:06:28Z2024-11-22T12:06:28ZYazar Woo, Taeho.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439881590">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>