Arama Sonuçları Measurement - Daraltılmış: Systems engineering.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMeasurement$0026qf$003dSUBJECT$002509Konu$002509Systems$002bengineering.$002509Systems$002bengineering.$0026ic$003dtrue$0026ps$003d300?
2024-11-12T00:48:07Z
Contactless VLSI Measurement and Testing Techniques
ent://SD_ILS/0/SD_ILS:401142
2024-11-12T00:48:07Z
2024-11-12T00:48:07Z
Yazar Sayil, Selahattin. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-69673-7">https://doi.org/10.1007/978-3-319-69673-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Instrumentation, Measurement, Circuits and Systems
ent://SD_ILS/0/SD_ILS:196167
2024-11-12T00:48:07Z
2024-11-12T00:48:07Z
Yazar Zhang, Tianbiao. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-27334-6">http://dx.doi.org/10.1007/978-3-642-27334-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Functional Verification Coverage Measurement and Analysis
ent://SD_ILS/0/SD_ILS:170041
2024-11-12T00:48:07Z
2024-11-12T00:48:07Z
Yazar Piziali, Andrew. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b117979">http://dx.doi.org/10.1007/b117979</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Supportability engineering handbook implementation, measurement, and management
ent://SD_ILS/0/SD_ILS:293555
2024-11-12T00:48:07Z
2024-11-12T00:48:07Z
Yazar Jones, James V.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/supportability-engineering-handbook">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Compact Models and Measurement Techniques for High-Speed Interconnects
ent://SD_ILS/0/SD_ILS:173845
2024-11-12T00:48:07Z
2024-11-12T00:48:07Z
Yazar Sharma, Rohit. author. Chakravarty, Tapas. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-1071-3">http://dx.doi.org/10.1007/978-1-4614-1071-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors
ent://SD_ILS/0/SD_ILS:336233
2024-11-12T00:48:07Z
2024-11-12T00:48:07Z
Yazar Im, Seongil. author. Chang, Youn-Gyoung. author. Kim, Jae Hoon. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(336233.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-94-007-6392-0">http://dx.doi.org/10.1007/978-94-007-6392-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Quantitative measurements for logistics
ent://SD_ILS/0/SD_ILS:293604
2024-11-12T00:48:07Z
2024-11-12T00:48:07Z
Yazar Frohne, Philip T. SOLE--The International Society of Logistics.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/quantitative-measurements-for-logistics">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Instrumentation design studies
ent://SD_ILS/0/SD_ILS:291508
2024-11-12T00:48:07Z
2024-11-12T00:48:07Z
Yazar Doebelin, Ernest O.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439819494">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>