Arama Sonuçları Measurement Science and Instrumentation. - Daraltılmış: Nanotechnology.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMeasurement$002bScience$002band$002bInstrumentation.$0026qf$003dSUBJECT$002509Konu$002509Nanotechnology.$002509Nanotechnology.$0026ic$003dtrue$0026ps$003d300?dt=list
2024-11-25T21:13:09Z
Ellipsometry at the Nanoscale
ent://SD_ILS/0/SD_ILS:333782
2024-11-25T21:13:09Z
2024-11-25T21:13:09Z
Yazar Losurdo, Maria. editor. Hingerl, Kurt. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333782.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-33956-1">http://dx.doi.org/10.1007/978-3-642-33956-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Surface Science Techniques
ent://SD_ILS/0/SD_ILS:333819
2024-11-25T21:13:09Z
2024-11-25T21:13:09Z
Yazar Bracco, Gianangelo. editor. Holst, Bodil. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333819.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-34243-1">http://dx.doi.org/10.1007/978-3-642-34243-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>