Arama Sonu&ccedil;lar&#305; Mechanisms - Daralt&#305;lm&#305;&#351;: Electronics. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMechanisms$0026qf$003dSUBJECT$002509Konu$002509Electronics.$002509Electronics.$0026ps$003d300? 2026-01-31T10:08:27Z High Velocity Microparticles in Space Influence Mechanisms and Mitigating Effects of Electromagnetic Irradiation ent://SD_ILS/0/SD_ILS:483712 2026-01-31T10:08:27Z 2026-01-31T10:08:27Z Yazar&#160;Belous, Anatoly. author.&#160;Saladukha, Vitali. author.&#160;Shvedau, Siarhei. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-04158-8">https://doi.org/10.1007/978-3-030-04158-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects ent://SD_ILS/0/SD_ILS:168463 2026-01-31T10:08:27Z 2026-01-31T10:08:27Z Yazar&#160;Grossmann, G&uuml;nter. editor.&#160;Zardini, Christian. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-236-0">http://dx.doi.org/10.1007/978-0-85729-236-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms ent://SD_ILS/0/SD_ILS:181391 2026-01-31T10:08:27Z 2026-01-31T10:08:27Z Yazar&#160;Li, Flora M. author.&#160;Nathan, Arokia. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/b139047">http://dx.doi.org/10.1007/b139047</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Polymer matrix wave-transparent composites : materials, properties, and applications ent://SD_ILS/0/SD_ILS:598987 2026-01-31T10:08:27Z 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Defects in organic semiconductors and devices ent://SD_ILS/0/SD_ILS:598531 2026-01-31T10:08:27Z 2026-01-31T10:08:27Z Yazar&#160;Nguyen, Thien-Phap, author.<br/>Yer Numaras&#305;&#160;TK7871.99 .O74 N48 2023<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394229451">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394229451</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Graphene field-effect transistors : advanced bioelectronic devices for sensing applications ent://SD_ILS/0/SD_ILS:598617 2026-01-31T10:08:27Z 2026-01-31T10:08:27Z Yazar&#160;Azzaroni, Omar, editor.&#160;Knoll, Wolfgang, editor.<br/>Yer Numaras&#305;&#160;TK7871.95 .G73 2023<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527843374">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527843374</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i 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(Jeremy M.), author.<br/>Yer Numaras&#305;&#160;TK7870<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118694541">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118694541</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Intelligent data analysis : from data gathering to data comprehension ent://SD_ILS/0/SD_ILS:595918 2026-01-31T10:08:27Z 2026-01-31T10:08:27Z Yazar&#160;Gupta, Deepak, active 2015-2016, editor.<br/>Yer Numaras&#305;&#160;QA76.9 .D343 I57435 2020<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119544487">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119544487</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Whole-angle MEMs gyroscopes : challenges and opportunities ent://SD_ILS/0/SD_ILS:595990 2026-01-31T10:08:27Z 2026-01-31T10:08:27Z Yazar&#160;Senkal, Doruk, 1984- author.&#160;Shkel, Andrei, author.<br/>Yer Numaras&#305;&#160;TJ209 .S46 2020<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119441908">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119441908</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> LTE communications and networks : femtocells and antenna design challenges ent://SD_ILS/0/SD_ILS:594292 2026-01-31T10:08:27Z 2026-01-31T10:08:27Z Yazar&#160;Ur-Rehman, Masood, editor.&#160;Safdar, Ghazanfar Ali, 1973- editor.<br/>Yer Numaras&#305;&#160;TK5103.48325 .L7346 2018<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119385271">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119385271</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment ent://SD_ILS/0/SD_ILS:593728 2026-01-31T10:08:27Z 2026-01-31T10:08:27Z Yazar&#160;Modarres, M. (Mohammad), author.&#160;Amiri, Mehdi, author.&#160;Jackson, Christopher, 1979- author.<br/>Yer Numaras&#305;&#160;TA169.5<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Atomic Layer Deposition for Semiconductors ent://SD_ILS/0/SD_ILS:530831 2026-01-31T10:08:27Z 2026-01-31T10:08:27Z Yazar&#160;Hwang, Cheol Seong. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-1-4614-8054-9">https://doi.org/10.1007/978-1-4614-8054-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>