Arama Sonuçları Memory. - Daraltılmış: Microprocessors.
SirsiDynix Enterprise
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2026-04-06T06:04:22Z
Memory, microprocessor, and ASIC
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2026-04-06T06:04:22Z
2026-04-06T06:04:22Z
Yazar Chen, Wai-Kai, 1936-<br/>Yer Numarası TK7895 .M4 V57 2003<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135499266">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Dynamic Memory Management for Embedded Systems
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Emerging Memory Technologies Design, Architecture, and Applications
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2026-04-06T06:04:22Z
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Yazar Xie, Yuan. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4419-9551-3">https://doi.org/10.1007/978-1-4419-9551-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
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High Energy Efficiency Neural Network Processor with Combined Digital and Computing-in-Memory Architecture
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Yazar Yue, Jinshan. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-97-3477-1">https://doi.org/10.1007/978-981-97-3477-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
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Multi-run Memory Tests for Pattern Sensitive Faults
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Yazar Mrozek, Ireneusz. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-91204-2">https://doi.org/10.1007/978-3-319-91204-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
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Yazar Goossens, Sven. author. Chandrasekar, Karthik. author. Akesson, Benny. author. Goossens, Kees. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-32094-6">https://doi.org/10.1007/978-3-319-32094-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
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Microprocessor. 1, Prolegomena -- Calculation and storage functions -- Models of computation and computer architecture
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Yazar Darche, Philippe.<br/>Yer Numarası QA76.5 .D37 2020 EB<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119779667">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119779667</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
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Yazar Darche, Philippe.<br/>Yer Numarası QA76.5<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119788355">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119788355</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
VLSI Design and Test 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers
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Yazar Kaushik, Brajesh Kumar. editor. Dasgupta, Sudeb. editor. Singh, Virendra. editor. (orcid)0000-0002-9113-5167 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-7470-7">https://doi.org/10.1007/978-981-10-7470-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
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Yazar Chattopadhyay, Anupam. editor. (orcid)0000-0002-8818-6983 Chang, Chip Hong. editor. Yu, Hao. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-54840-1">https://doi.org/10.1007/978-3-319-54840-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
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Yazar Ding, Chen. editor. Criswell, John. editor. Wu, Peng. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-52709-3">https://doi.org/10.1007/978-3-319-52709-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
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2026-04-06T06:04:22Z
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