Arama Sonu&ccedil;lar&#305; Metadata - Daralt&#305;lm&#305;&#351;: Reliability (Engineering) SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMetadata$0026qf$003dSUBJECT$002509Subject$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ic$003dtrue$0026ps$003d300? 2025-12-24T23:09:28Z Guidelines for failure modes and effects analysis for medical devices ent://SD_ILS/0/SD_ILS:543242 2025-12-24T23:09:28Z 2025-12-24T23:09:28Z Yazar&#160;PRESS, DYADEM.<br/>Yer Numaras&#305;&#160;R856.6<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429205804">https://www.taylorfrancis.com/books/9780429205804</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> What every engineer should know about decision making under uncertainty ent://SD_ILS/0/SD_ILS:544345 2025-12-24T23:09:28Z 2025-12-24T23:09:28Z Yazar&#160;Wang, John X., 1962-&#160;CRC Press.<br/>Yer Numaras&#305;&#160;TA190 .W36 2005<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429222733">https://www.taylorfrancis.com/books/9780429222733</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mechanical reliability improvement : probability and statistics for experimental testing ent://SD_ILS/0/SD_ILS:541297 2025-12-24T23:09:28Z 2025-12-24T23:09:28Z Yazar&#160;Little, R. E. (Robert Eugene), 1933-&#160;Kosikowski, D. M.<br/>Yer Numaras&#305;&#160;TA169 L778 2003<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429213335">https://www.taylorfrancis.com/books/9780429213335</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design reliability : fundamentals and applications ent://SD_ILS/0/SD_ILS:540572 2025-12-24T23:09:28Z 2025-12-24T23:09:28Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;TA174 .D4929 1999<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420050141">https://www.taylorfrancis.com/books/9781420050141</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802400">https://www.taylorfrancis.com/books/9780367802400</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>