Arama Sonu&ccedil;lar&#305; Metadata. - Daralt&#305;lm&#305;&#351;: Reliability (Engineering) SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMetadata.$0026qf$003dSUBJECT$002509Konu$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ps$003d300$0026isd$003dtrue?dt=list 2026-01-07T23:24:11Z Designing faultless mechanical products based on advanced reliability analysis ent://SD_ILS/0/SD_ILS:590951 2026-01-07T23:24:11Z 2026-01-07T23:24:11Z Yazar&#160;Woo, Seongwoo, 1966- author.<br/>Yer Numaras&#305;&#160;TS173<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003451471">https://www.taylorfrancis.com/books/9781003451471</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Barrier engineering : models and methods for technical safety ent://SD_ILS/0/SD_ILS:592524 2026-01-07T23:24:11Z 2026-01-07T23:24:11Z Yazar&#160;Liu, Yiliu, author.<br/>Yer Numaras&#305;&#160;TA169.7<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003245636">https://www.taylorfrancis.com/books/9781003245636</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Industrial reliability and safety engineering : applications and practices ent://SD_ILS/0/SD_ILS:578979 2026-01-07T23:24:11Z 2026-01-07T23:24:11Z Yazar&#160;Panchal, Dilbagh, editor.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003140092">https://www.taylorfrancis.com/books/9781003140092</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied reliability, usability, and quality for engineers ent://SD_ILS/0/SD_ILS:579176 2026-01-07T23:24:11Z 2026-01-07T23:24:11Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947- author.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003298571">https://www.taylorfrancis.com/books/9781003298571</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> What every engineer should know about risk engineering and management ent://SD_ILS/0/SD_ILS:581243 2026-01-07T23:24:11Z 2026-01-07T23:24:11Z Yazar&#160;Wang, John X., 1962- author.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003371014">https://www.taylorfrancis.com/books/9781003371014</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability and maintenance modeling with optimization : advances and applications ent://SD_ILS/0/SD_ILS:562446 2026-01-07T23:24:11Z 2026-01-07T23:24:11Z Yazar&#160;Kimura, Mitsutaka, editor.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003095231">https://www.taylorfrancis.com/books/9781003095231</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> What every engineer should know about reliability and risk analysis ent://SD_ILS/0/SD_ILS:565637 2026-01-07T23:24:11Z 2026-01-07T23:24:11Z Yazar&#160;Modarres, M. (Mohammad), author.&#160;Groth, Katrina, author.<br/>Yer Numaras&#305;&#160;TA169 .M63 2023<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003307495">https://www.taylorfrancis.com/books/9781003307495</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Optimal reliability-based design of structures against several natural hazards ent://SD_ILS/0/SD_ILS:558659 2026-01-07T23:24:11Z 2026-01-07T23:24:11Z Yazar&#160;Ang, Alfredo Hua-Sing, 1930- author.&#160;De Leon, David (De Leon Escobido), author.&#160;Fan, Wenliang, author.<br/>Yer Numaras&#305;&#160;TA658 .A56 2022<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003177289">https://www.taylorfrancis.com/books/9781003177289</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> RELIABILITY ENGINEERING a life cycle approach. ent://SD_ILS/0/SD_ILS:575297 2026-01-07T23:24:11Z 2026-01-07T23:24:11Z Yazar&#160;Bradley, Edgar.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003326489">https://www.taylorfrancis.com/books/9781003326489</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Philosophies of structural safety and reliability ent://SD_ILS/0/SD_ILS:582933 2026-01-07T23:24:11Z 2026-01-07T23:24:11Z Yazar&#160;Ra&#301;zer, V. D. (Vladimir Davidovich), author.&#160;Elishakoff, Isaac, author.<br/>Yer Numaras&#305;&#160;TA656<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003265993">https://www.taylorfrancis.com/books/9781003265993</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Applied reliability for engineers ent://SD_ILS/0/SD_ILS:565385 2026-01-07T23:24:11Z 2026-01-07T23:24:11Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947- author.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003132103">https://www.taylorfrancis.com/books/9781003132103</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design of mechanical systems based on statistics : a guide to improving product reliability ent://SD_ILS/0/SD_ILS:585409 2026-01-07T23:24:11Z 2026-01-07T23:24:11Z Yazar&#160;Woo, Seong-woo, author.<br/>Yer Numaras&#305;&#160;TJ245.5<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429022050">https://www.taylorfrancis.com/books/9780429022050</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Power systems control and reliability : electric power design and enhancement ent://SD_ILS/0/SD_ILS:562263 2026-01-07T23:24:11Z 2026-01-07T23:24:11Z Yazar&#160;Qamber, Isa S., author.<br/>Yer Numaras&#305;&#160;TK1001 .Q36 2020<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429287015">https://www.taylorfrancis.com/books/9780429287015</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability management and engineering : challenges and future trends ent://SD_ILS/0/SD_ILS:583504 2026-01-07T23:24:11Z 2026-01-07T23:24:11Z Yazar&#160;Garg, Harish, editor.&#160;Ram, Mangey, editor.<br/>Yer Numaras&#305;&#160;TA169<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429268922">https://www.taylorfrancis.com/books/9780429268922</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability, maintainability, and safety for engineers ent://SD_ILS/0/SD_ILS:590317 2026-01-07T23:24:11Z 2026-01-07T23:24:11Z Yazar&#160;Dhillon, B. S., author.<br/>Yer Numaras&#305;&#160;TS173<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429340574">https://www.taylorfrancis.com/books/9780429340574</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Guidelines for failure modes and effects analysis for medical devices ent://SD_ILS/0/SD_ILS:543242 2026-01-07T23:24:11Z 2026-01-07T23:24:11Z Yazar&#160;PRESS, DYADEM.<br/>Yer Numaras&#305;&#160;R856.6<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429205804">https://www.taylorfrancis.com/books/9780429205804</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> What every engineer should know about decision making under uncertainty ent://SD_ILS/0/SD_ILS:544345 2026-01-07T23:24:11Z 2026-01-07T23:24:11Z Yazar&#160;Wang, John X., 1962-&#160;CRC Press.<br/>Yer Numaras&#305;&#160;TA190 .W36 2005<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429222733">https://www.taylorfrancis.com/books/9780429222733</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mechanical reliability improvement : probability and statistics for experimental testing ent://SD_ILS/0/SD_ILS:541297 2026-01-07T23:24:11Z 2026-01-07T23:24:11Z Yazar&#160;Little, R. E. (Robert Eugene), 1933-&#160;Kosikowski, D. M.<br/>Yer Numaras&#305;&#160;TA169 L778 2003<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429213335">https://www.taylorfrancis.com/books/9780429213335</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design reliability : fundamentals and applications ent://SD_ILS/0/SD_ILS:540572 2026-01-07T23:24:11Z 2026-01-07T23:24:11Z Yazar&#160;Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numaras&#305;&#160;TA174 .D4929 1999<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420050141">https://www.taylorfrancis.com/books/9781420050141</a> Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802400">https://www.taylorfrancis.com/books/9780367802400</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>