Arama Sonu&ccedil;lar&#305; Methodology. - Daralt&#305;lm&#305;&#351;: Electronic books. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMethodology.$0026qf$003dSUBJECT$002509Konu$002509Electronic$002bbooks.$002509Electronic$002bbooks.$0026te$003dILS$0026ps$003d300$0026isd$003dtrue? 2024-11-07T19:46:35Z Evolving intelligent systems methodology and applications ent://SD_ILS/0/SD_ILS:249863 2024-11-07T19:46:35Z 2024-11-07T19:46:35Z Yazar&#160;Angelov, Plamen.&#160;Filev, Dimitar P., 1959-&#160;Kasabov, Nikola K.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5487867">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5487867</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Optical bit error rate an estimation methodology ent://SD_ILS/0/SD_ILS:249764 2024-11-07T19:46:35Z 2024-11-07T19:46:35Z Yazar&#160;Kartalopoulos, Stamatios V.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263060">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263060</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Problem solving and data analysis using Minitab : a clear and easy guide to six sigma methodology ent://SD_ILS/0/SD_ILS:299348 2024-11-07T19:46:35Z 2024-11-07T19:46:35Z Yazar&#160;Khan, Rehman M.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley Online Library <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118307502">http://onlinelibrary.wiley.com/book/10.1002/9781118307502</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118307502">http://dx.doi.org/10.1002/9781118307502</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781118307571.jpg">http://catalogimages.wiley.com/images/db/jimages/9781118307571.jpg</a> ebrary <a href="http://site.ebrary.com/id/10657930">http://site.ebrary.com/id/10657930</a> <a href="http://rbdigital.oneclickdigital.com">http://rbdigital.oneclickdigital.com</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical and managerial techniques for six sigma methodology theory and application ent://SD_ILS/0/SD_ILS:305612 2024-11-07T19:46:35Z 2024-11-07T19:46:35Z Yazar&#160;Barone, Stefano.&#160;Franco, Eva Lo.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119968405">An electronic book accessible through the World Wide Web; 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(Baek Ho)&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5959848">http://ieeexplore.ieee.org/servlet/opac?bknumber=5959848</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Robust design methodology for reliability exploring the effects of variation and uncertainty ent://SD_ILS/0/SD_ILS:298396 2024-11-07T19:46:35Z 2024-11-07T19:46:35Z Yazar&#160;Bergman, Bo, 1943-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=454321</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470748794">http://dx.doi.org/10.1002/9780470748794</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg">http://catalogimages.wiley.com/images/db/jimages/9780470713945.jpg</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10331496">http://site.ebrary.com/lib/alltitles/Doc?id=10331496</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> VLSI circuit design methodology demystified a practical approach for building up concepts ent://SD_ILS/0/SD_ILS:249502 2024-11-07T19:46:35Z 2024-11-07T19:46:35Z Yazar&#160;Xiu, Liming.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361012">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361012</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Survey methods in multinational, multiregional, and multicultural contexts ent://SD_ILS/0/SD_ILS:297956 2024-11-07T19:46:35Z 2024-11-07T19:46:35Z Yazar&#160;Harkness, Janet A., 1948-&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470609927">http://dx.doi.org/10.1002/9780470609927</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10388298">http://site.ebrary.com/lib/alltitles/Doc?id=10388298</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Statistical disclosure control ent://SD_ILS/0/SD_ILS:299467 2024-11-07T19:46:35Z 2024-11-07T19:46:35Z Yazar&#160;Hundepool, Anco.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118348239">An electronic book accessible through the World Wide Web; 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J., 1936- author.<br/>Yer Numaras&#305;&#160;ONLINE(341530.1)<br/>Elektronik Eri&#351;im&#160;ebrary <a href="http://alltitles.ebrary.com/Doc?id=10849239">An electronic book accessible through the World Wide Web; click to view</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781119940494.jpg">http://catalogimages.wiley.com/images/db/jimages/9781119940494.jpg</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118402719">http://dx.doi.org/10.1002/9781118402719</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> A practical guide to data mining for business and industry ent://SD_ILS/0/SD_ILS:341752 2024-11-07T19:46:35Z 2024-11-07T19:46:35Z Yazar&#160;Ahlemeyer-Stubbe, Andrea, author.<br/>Yer Numaras&#305;&#160;ONLINE(341752.1)<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781118763704">http://dx.doi.org/10.1002/9781118763704</a> <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118763704">http://onlinelibrary.wiley.com/book/10.1002/9781118763704</a> <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=746951">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=746951</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63686">http://www.books24x7.com/marc.asp?bookid=63686</a> <a href="http://lib.myilibrary.com/detail.asp?id=586320">http://lib.myilibrary.com/detail.asp?id=586320</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Bayesian networks for probabilistic inference and decision analysis in forensic science ent://SD_ILS/0/SD_ILS:342015 2024-11-07T19:46:35Z 2024-11-07T19:46:35Z Yazar&#160;Taroni, Franco, author.&#160;Biedermann, Alex, author.&#160;Bozza, Silvia, author.&#160;Garbolino, Paolo, 1955- author.&#160;Aitken, C. G. G., author.<br/>Yer Numaras&#305;&#160;ONLINE(342015.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://proquest.safaribooksonline.com/?fpi=9781118914748">Available by subscription from Safari Books Online</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118914762">http://dx.doi.org/10.1002/9781118914762</a> Wiley Online Library <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118914762">http://onlinelibrary.wiley.com/book/10.1002/9781118914762</a> Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118914748">http://proquest.tech.safaribooksonline.de/9781118914748</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Different under God a survey of church-going Protestants in Singapore ent://SD_ILS/0/SD_ILS:239541 2024-11-07T19:46:35Z 2024-11-07T19:46:35Z Yazar&#160;Chong, Terence.&#160;Hui, Yew-Foong.&#160;Project Muse.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://muse.jhu.edu/books/9789814414432/">Full text available: </a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Understanding and applying research design ent://SD_ILS/0/SD_ILS:305441 2024-11-07T19:46:35Z 2024-11-07T19:46:35Z Yazar&#160;Abbott, Martin, 1949-&#160;McKinney, Jennifer, 1969-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1120726">Click here to view book</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118647325">http://dx.doi.org/10.1002/9781118647325</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=1120726">http://swb.eblib.com/patron/FullRecord.aspx?p=1120726</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Understanding business research ent://SD_ILS/0/SD_ILS:299453 2024-11-07T19:46:35Z 2024-11-07T19:46:35Z Yazar&#160;Weathington, Bart L.&#160;Cunningham, Christopher J. 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Sel&ccedil;uk, 1951-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=244365">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=244365</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Research methods in community medicine surveys, epidemiological research, programme evaluation, clinical trials ent://SD_ILS/0/SD_ILS:302931 2024-11-07T19:46:35Z 2024-11-07T19:46:35Z Yazar&#160;Abramson, J. H. (Joseph Herbert), 1924-&#160;Abramson, Z. H.&#160;Abramson, J. H. (Joseph Herbert), 1924- Survey methods in community medicine.&#160;Abramson, J. H. 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