Arama Sonu&ccedil;lar&#305; Metrologie. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMetrologie.$0026ps$003d300? 2024-11-13T18:11:10Z Metrologie des radionuclides par ent://SD_ILS/0/SD_ILS:68897 2024-11-13T18:11:10Z 2024-11-13T18:11:10Z Yazar&#160;Vuccino, Simone.<br/>Yer Numaras&#305;&#160;QC 795 V79 1968<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Metrology in industry the key for quality ent://SD_ILS/0/SD_ILS:297585 2024-11-13T18:11:10Z 2024-11-13T18:11:10Z Yazar&#160;Coll&egrave;ge fran&ccedil;ais de m&eacute;trologie.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470612125">http://dx.doi.org/10.1002/9780470612125</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France ent://SD_ILS/0/SD_ILS:297966 2024-11-13T18:11:10Z 2024-11-13T18:11:10Z Yazar&#160;International Metrology Conference (13th : 2007 : French College of Metrology)&#160;Coll&egrave;ge fran&ccedil;ais de m&eacute;trologie.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470611371">http://dx.doi.org/10.1002/9780470611371</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10360928">http://site.ebrary.com/lib/alltitles/Doc?id=10360928</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=477706">http://swb.eblib.com/patron/FullRecord.aspx?p=477706</a> HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/230183422.html">http://catalog.hathitrust.org/api/volumes/oclc/230183422.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fundamental principles of engineering nanometrology ent://SD_ILS/0/SD_ILS:355774 2024-11-13T18:11:10Z 2024-11-13T18:11:10Z Yazar&#160;Leach, R. K.<br/>Yer Numaras&#305;&#160;ONLINE(355774.1)<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781455777532">http://www.sciencedirect.com/science/book/9781455777532</a> <a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Speckle metrology ent://SD_ILS/0/SD_ILS:256067 2024-11-13T18:11:10Z 2024-11-13T18:11:10Z Yazar&#160;Erf, Robert K.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780122413605">http://www.sciencedirect.com/science/book/9780122413605</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>