Arama Sonuçları Metrologie. - Daraltılmış: English
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMetrologie.$0026qf$003dLANGUAGE$002509Dil$002509ENG$002509English$0026ic$003dtrue$0026ps$003d300?dt=list
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Metrologie des radionuclides par
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Yazar Vuccino, Simone.<br/>Yer Numarası QC 795 V79 1968<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>
Metrology in industry the key for quality
ent://SD_ILS/0/SD_ILS:297585
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Yazar Collège français de métrologie. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470612125">http://dx.doi.org/10.1002/9780470612125</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
ent://SD_ILS/0/SD_ILS:297966
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Yazar International Metrology Conference (13th : 2007 : French College of Metrology) Collège français de métrologie. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470611371">http://dx.doi.org/10.1002/9780470611371</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10360928">http://site.ebrary.com/lib/alltitles/Doc?id=10360928</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=477706">http://swb.eblib.com/patron/FullRecord.aspx?p=477706</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/230183422.html">http://catalog.hathitrust.org/api/volumes/oclc/230183422.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fundamental principles of engineering nanometrology
ent://SD_ILS/0/SD_ILS:355774
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Yazar Leach, R. K.<br/>Yer Numarası ONLINE(355774.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781455777532">http://www.sciencedirect.com/science/book/9781455777532</a>
<a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Speckle metrology
ent://SD_ILS/0/SD_ILS:256067
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Yazar Erf, Robert K.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780122413605">http://www.sciencedirect.com/science/book/9780122413605</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>