Arama Sonuçları Metrologie. - Daraltılmış: Metrology.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMetrologie.$0026qf$003dSUBJECT$002509Konu$002509Metrology.$002509Metrology.$0026ic$003dtrue$0026ps$003d300?2024-11-14T20:22:36ZMetrology in industry the key for qualityent://SD_ILS/0/SD_ILS:2975852024-11-14T20:22:36Z2024-11-14T20:22:36ZYazar Collège français de métrologie. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470612125">http://dx.doi.org/10.1002/9780470612125</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamental principles of engineering nanometrologyent://SD_ILS/0/SD_ILS:3557742024-11-14T20:22:36Z2024-11-14T20:22:36ZYazar Leach, R. K.<br/>Yer Numarası ONLINE(355774.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781455777532">http://www.sciencedirect.com/science/book/9781455777532</a>
<a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>