Arama Sonuçları MetrologySirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMetrology$0026ps$003d300$0026isd$003dtrue?2026-01-01T01:34:50ZMetrologyent://SD_ILS/0/SD_ILS:4853792026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Gao, Wei. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-4938-5">https://doi.org/10.1007/978-981-10-4938-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mass Metrologyent://SD_ILS/0/SD_ILS:1953362026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Gupta, S. V. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-23412-5">http://dx.doi.org/10.1007/978-3-642-23412-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Optical metrologyent://SD_ILS/0/SD_ILS:3188192026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Gåsvik, Kjell J.<br/>Yer Numarası ONLINE(318819.1)<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10332978">http://site.ebrary.com/lib/alltitles/Doc?id=10332978</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of Metrology and Applicationsent://SD_ILS/0/SD_ILS:5284222026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Aswal, Dinesh K. editor. Yadav, Sanjay. editor. Takatsuji, Toshiyuki. editor. Rachakonda, Prem. editor. Kumar, Harish. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-2074-7">https://doi.org/10.1007/978-981-99-2074-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of optical dimensional metrologyent://SD_ILS/0/SD_ILS:5425982026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Harding, Kevin G.<br/>Yer Numarası T50 .H268 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439854822">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Instrumentation and metrology in oceanographyent://SD_ILS/0/SD_ILS:3053952026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Le Menn, Marc.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ebrary <a href="http://oclc-marc.ebrary.com/Doc?id=10684971">An electronic book accessible through the World Wide Web; click to view</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10575536">http://site.ebrary.com/lib/alltitles/Doc?id=10575536</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Springer Handbook of Metrology and Testingent://SD_ILS/0/SD_ILS:1933642026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Czichos, Horst. editor. Saito, Tetsuya. editor. Smith, Leslie. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-16641-9">http://dx.doi.org/10.1007/978-3-642-16641-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Information Modeling for Interoperable Dimensional Metrologyent://SD_ILS/0/SD_ILS:1733772026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Zhao, Yaoyao (Fiona). author. Brown, Robert. author. Kramer, Thomas R. author. Xu, Xun. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-2167-1">http://dx.doi.org/10.1007/978-1-4471-2167-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Software metrics and software metrologyent://SD_ILS/0/SD_ILS:2493192026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Abran, Alain, 1949-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computational Surface and Roundness Metrologyent://SD_ILS/0/SD_ILS:1758022026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Muralikrishnan, Bala. author. Raja, Jay. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-297-5">http://dx.doi.org/10.1007/978-1-84800-297-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>X-ray metrology in semiconductor manufacturingent://SD_ILS/0/SD_ILS:5435112026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Bowen, D. Keith (David Keith), 1940- author. Tanner, B. K. (Brian Keith)<br/>Yer Numarası TK7874.58 .B69 2006<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420005653">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of silicon semiconductor metrologyent://SD_ILS/0/SD_ILS:5472442026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Diebold, A. C. (Alain C.)<br/>Yer Numarası TK7871.85 .H3337 2001<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135554842">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Metrology for Fire Experiments in Outdoor Conditionsent://SD_ILS/0/SD_ILS:3323732026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Silvani, Xavier. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332373.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-7962-8">http://dx.doi.org/10.1007/978-1-4614-7962-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Graphene Nanoelectronics Metrology, Synthesis, Properties and Applicationsent://SD_ILS/0/SD_ILS:1952032026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Raza, Hassan. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-22984-8">http://dx.doi.org/10.1007/978-3-642-22984-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in speckle metrology and related techniquesent://SD_ILS/0/SD_ILS:3060592026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Kaufmann, Guillermo H.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527633852">An electronic book accessible through the World Wide Web; click for information</a>
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<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697681">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697681</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Distributed Large-Scale Dimensional Metrology New Insightsent://SD_ILS/0/SD_ILS:1685312026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Franceschini, Fiorenzo. author. Galetto, Maurizio. author. Maisano, Domenico. author. Mastrogiacomo, Luca. author. Pralio, Barbara. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-543-9">http://dx.doi.org/10.1007/978-0-85729-543-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of optical metrology : principles and applicationsent://SD_ILS/0/SD_ILS:5409702026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Yoshizawa, Toru, 1939-<br/>Yer Numarası QC367 .H36 2009<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420019513">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Metrology in industry the key for qualityent://SD_ILS/0/SD_ILS:2975852026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Collège français de métrologie. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470612125">http://dx.doi.org/10.1002/9780470612125</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, Franceent://SD_ILS/0/SD_ILS:2979662026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar International Metrology Conference (13th : 2007 : French College of Metrology) Collège français de métrologie. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9783527664344">http://dx.doi.org/10.1002/9783527664344</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanicsent://SD_ILS/0/SD_ILS:1736242026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Proulx, Tom. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-0228-2">http://dx.doi.org/10.1007/978-1-4614-0228-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocksent://SD_ILS/0/SD_ILS:1770702026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Hebra, Alexius J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-211-78381-8">http://dx.doi.org/10.1007/978-3-211-78381-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Data Modeling for Metrology and Testing in Measurement Scienceent://SD_ILS/0/SD_ILS:1682952026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Pavese, Franco. editor. Forbes, Alistair B. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-8176-4804-6">http://dx.doi.org/10.1007/978-0-8176-4804-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fringe 2009 6th International Workshop on Advanced Optical Metrologyent://SD_ILS/0/SD_ILS:1905032026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Osten, Wolfgang. editor. Kujawinska, Malgorzata. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-03051-2">http://dx.doi.org/10.1007/978-3-642-03051-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quality Assurance for Chemistry and Environmental Science Metrology from pH Measurement to Nuclear Waste Disposalent://SD_ILS/0/SD_ILS:1862312026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Meinrath, G. author. Schneider, Petra. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-71273-2">http://dx.doi.org/10.1007/978-3-540-71273-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Microwave Circuit Theory and Foundations of Microwave Metrologyent://SD_ILS/0/SD_ILS:2477702026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Engen, Glenn F.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBEL009E">http://dx.doi.org/10.1049/PBEL009E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of surface and nanometrologyent://SD_ILS/0/SD_ILS:5420192026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Whitehouse, D. J. (David J.), author. Whitehouse, D. J. (David J.). Handbook of surface metrology.<br/>Yer Numarası TA418.7 .W47 2011<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420082029">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of surface and nanometrologyent://SD_ILS/0/SD_ILS:5450512026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Whitehouse, D. J. (David J.), author. Whitehouse, D. J. (David J.). Handbook of surface metrology.<br/>Yer Numarası TA418.7 .W45 2003<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420034196">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Proceedings of CASICAM 2022ent://SD_ILS/0/SD_ILS:5274552026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Zarbane, Khalid. editor. Beidouri, Zitouni. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-32927-2">https://doi.org/10.1007/978-3-031-32927-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Proceedings of the International Conference on Information Control, Electrical Engineering and Rail Transit ICEERT 2022ent://SD_ILS/0/SD_ILS:5288252026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Yadav, Sanjay. editor. Kumar, Rahul. editor. Zainuddin, Hidayat. editor. Deng, Lvxiang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-6431-4">https://doi.org/10.1007/978-981-99-6431-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Clinical and Laboratory Medicine Textbookent://SD_ILS/0/SD_ILS:5222492026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Ciaccio, Marcello. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-24958-7">https://doi.org/10.1007/978-3-031-24958-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Rotating Machinery, Optical Methods & Scanning LDV Methods, Volume 6 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022ent://SD_ILS/0/SD_ILS:5273802026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Di Maio, Dario. editor. Baqersad, Javad. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-04098-6">https://doi.org/10.1007/978-3-031-04098-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Sensors and Instrumentation, Aircraft/Aerospace and Dynamic Environments Testing, Volume 7 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022ent://SD_ILS/0/SD_ILS:5281732026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Walber, Chad. editor. Stefanski, Matthew. editor. Harvie, Julie. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-05415-0">https://doi.org/10.1007/978-3-031-05415-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Recent Trends in Product Design and Intelligent Manufacturing Systems Select Proceedings of IPDIMS 2021ent://SD_ILS/0/SD_ILS:5284902026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Deepak, B.B.V.L. editor. Bahubalendruni, M.V.A. Raju. editor. Parhi, D.R.K. editor. Biswal, Bibhuti Bhusan. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-4606-6">https://doi.org/10.1007/978-981-19-4606-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Halal and Kosher Food Integration of Quality and Safety for Global Market Trendsent://SD_ILS/0/SD_ILS:5286252026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Ahmed Osman, Osman. editor. Moneim Elhadi Sulieman, Abdel. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-41459-6">https://doi.org/10.1007/978-3-031-41459-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Integrated Design and Production II Proceedings of the 12th International Conference on Integrated Design and Production, CPI 2022, May 10-12, 2022, ENSAM, Rabat, Moroccoent://SD_ILS/0/SD_ILS:5290092026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Azrar, Lahcen. editor. Jalid, Abdelilah. editor. Lamouri, Samir. editor. Siadat, Ali. editor. Taha Janan, Mourad. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-23615-0">https://doi.org/10.1007/978-3-031-23615-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applicationsent://SD_ILS/0/SD_ILS:5183922026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Liu, Zheng. editor. Ukida, Hiroyuki. editor. Ramuhalli, Pradeep. editor. Niel, Kurt. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4471-6741-9">https://doi.org/10.1007/978-1-4471-6741-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pattern Recognition and Machine Intelligence 6th International Conference, PReMI 2015, Warsaw, Poland, June 30 - July 3, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5191852026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Kryszkiewicz, Marzena. editor. Bandyopadhyay, Sanghamitra. editor. Rybinski, Henryk. editor. Pal, Sankar K. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-19941-2">https://doi.org/10.1007/978-3-319-19941-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Digital Holography and Wavefront Sensing Principles, Techniques and Applicationsent://SD_ILS/0/SD_ILS:5303682026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Schnars, Ulf. author. Falldorf, Claas. author. Watson, John. author. Jüptner, Werner. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-44693-5">https://doi.org/10.1007/978-3-662-44693-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Microstructuring of Thermo-Mechanically Highly Stressed Surfaces Final Report of the DFG Research Group 576ent://SD_ILS/0/SD_ILS:5294412026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Denkena, Berend. editor. Rienäcker, Adrian. editor. Knoll, Gunter. editor. Bach, Friedrich-Wilhelm. editor. Maier, Hans Jürgen. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-09692-6">https://doi.org/10.1007/978-3-319-09692-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5190352026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Paredes, Roberto. editor. Cardoso, Jaime S. editor. Pardo, Xosé M. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-19390-8">https://doi.org/10.1007/978-3-319-19390-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applications of EPR in Radiation Researchent://SD_ILS/0/SD_ILS:5307282026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Lund, Anders. editor. Shiotani, Masaru. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-09216-4">https://doi.org/10.1007/978-3-319-09216-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Optical devices in ophthalmology and optometry technology, design principles and clinical applicationsent://SD_ILS/0/SD_ILS:3421962026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Donnerhacke, Karl-Heinz. Rill, Michael Stefan. Kaschke, Michael F.<br/>Yer Numarası ONLINE(342196.1)<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9783527648962">http://dx.doi.org/10.1002/9783527648962</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Drills : science and technology of advanced operationsent://SD_ILS/0/SD_ILS:5391352026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Astakhov, Viktor P., author.<br/>Yer Numarası TJ1260 .A87 2014<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781466584358">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Luminescence : the instrumental key to the future of nanotechnologyent://SD_ILS/0/SD_ILS:5456212026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Gilmore, Adam M., editor.<br/>Yer Numarası QC476.5 .L86 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9789814267724">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Yasal metrolojient://SD_ILS/0/SD_ILS:3402572026-01-01T01:34:50Z2026-01-01T01:34:50ZYer Numarası QC89.T9 Y37 2013<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Electrical impedance : principles, measurement, and applicationsent://SD_ILS/0/SD_ILS:5426022026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Callegaro, Luca., author.<br/>Yer Numarası QC522 .C35 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439849118">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals of laser micromachiningent://SD_ILS/0/SD_ILS:5406252026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Schaeffer, Ronald D., author.<br/>Yer Numarası TA1675 .S33 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439860564">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>100 years of superconductivityent://SD_ILS/0/SD_ILS:5456112026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Rogalla, H. (Horst) Kes, P. H. (Peter H.)<br/>Yer Numarası QC611.96 .A16 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439849484">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Measurements with persons theory, methods, and implementation areasent://SD_ILS/0/SD_ILS:2623132026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Berglund, Birgitta.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.tandfebooks.com/isbn/9780203816660">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Coordinate measuring machines and systemsent://SD_ILS/0/SD_ILS:5468122026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Hocken, Robert J. Pereira, Paulo H.<br/>Yer Numarası TA165.5 .C66 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420017533">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Numeral Types and Changes Worldwideent://SD_ILS/0/SD_ILS:5322762026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Bisang, Walter, contributor. Comrie, Bernard, contributor. Edelman, Džoj (Joy) I., contributor. Gvozdanovic, Jadranka, editor. Gvozdanović, Jadranka, contributor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1515/9783110811193">https://doi.org/10.1515/9783110811193</a>
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Cover <a href="https://www.degruyter.com/document/cover/isbn/9783110811193/original">https://www.degruyter.com/document/cover/isbn/9783110811193/original</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer network time synchronization : the Network Time Protocol on Earth and in spaceent://SD_ILS/0/SD_ILS:5464682026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Mills, David L., author.<br/>Yer Numarası TK5105.575 .M55 2011<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315218151">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamental principles of engineering nanometrologyent://SD_ILS/0/SD_ILS:3557742026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Leach, R. K.<br/>Yer Numarası ONLINE(355774.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781455777532">http://www.sciencedirect.com/science/book/9781455777532</a>
<a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamental principles of engineering nanometrologyent://SD_ILS/0/SD_ILS:1458162026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Leach, R. K.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of photonics for biomedical scienceent://SD_ILS/0/SD_ILS:5476752026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Tuchin, V. V. (Valerii Viktorovich)<br/>Yer Numarası R857 .O6 H366 2010<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439806296">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Microcomputed tomography : methodology and applicationsent://SD_ILS/0/SD_ILS:5424802026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Stock, Stuart R., author.<br/>Yer Numarası RC78.7 .T6 S73 2009<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420058772">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of semiconductor manufacturing technologyent://SD_ILS/0/SD_ILS:5424412026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Doering, Robert, 1946- Nishi, Yoshio, 1940-<br/>Yer Numarası TK7871.85 .H3335 2008<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315213934">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Solid-state lasers and applicationsent://SD_ILS/0/SD_ILS:5445042026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Sennaroglu, Alphan.<br/>Yer Numarası TA1705 .S6748 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315222059">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Microlithography : science and technologyent://SD_ILS/0/SD_ILS:5424832026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Suzuki, Kazuaki. Smith, Bruce W., 1959-<br/>Yer Numarası TK7836 .M525 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420051537">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Optical inspection of microsystemsent://SD_ILS/0/SD_ILS:5425002026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Osten, Wolfgang.<br/>Yer Numarası TS156.2 .O652 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420019162">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Financial justification of nondestructive testing : cost of quality in manufacturingent://SD_ILS/0/SD_ILS:5429232026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Papadakis, Emmanuel P., author.<br/>Yer Numarası TA417.2 .P37 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420009705">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer network time synchronization : the network time protocolent://SD_ILS/0/SD_ILS:5408212026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Mills, David L., author.<br/>Yer Numarası TK5105.5 .M564 2006<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420006155">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of photomask manufacturing technologyent://SD_ILS/0/SD_ILS:5464912026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Rizvi, Syed.<br/>Yer Numarası TK7872 .M3 H36 2005<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420028782">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of Laser Technology and Applications (Three- Volume Set).ent://SD_ILS/0/SD_ILS:5410502026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Taylor and Francis.<br/>Yer Numarası TA1675 .H363 2003<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/e/9781420050530">Click here to view.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Evaluating the measurement uncertainty : fundamentals and practical guidanceent://SD_ILS/0/SD_ILS:5385562026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Lira, Ignacio, 1951- author.<br/>Yer Numarası T50<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367801564">https://www.taylorfrancis.com/books/9780367801564</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical density measurement and hydrometryent://SD_ILS/0/SD_ILS:5445512026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Gupta, S. V., author.<br/>Yer Numarası QD169 .W3<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367801496">https://www.taylorfrancis.com/books/9780367801496</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of mass measurementent://SD_ILS/0/SD_ILS:5459212026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Jones, Frank E., author. Schoonover, Randall M.<br/>Yer Numarası QC106 .J66 2002<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420038453">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of optical engineeringent://SD_ILS/0/SD_ILS:5422462026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Malacara, Daniel, 1937- Thompson, Brian J.<br/>Yer Numarası TA1520 .H368 2001<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135556525">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Assessment of Oral Health : Diagnostic Techniques and Validation Criteriaent://SD_ILS/0/SD_ILS:5486842026-01-01T01:34:50Z2026-01-01T01:34:50ZYazar Faller, R.V., editor.<br/>Yer Numarası XX(548684.1)<br/>Elektronik Erişim <a href="https://karger.com/book/doi/10.1159/isbn.978-3-318-00549-3">https://karger.com/book/doi/10.1159/isbn.978-3-318-00549-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>