Arama Sonuçları Metrology - Daraltılmış: Elektronik Kütüphane
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2026-06-03T01:48:56Z
Metrology
ent://SD_ILS/0/SD_ILS:485379
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Yazar Gao, Wei. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-4938-5">https://doi.org/10.1007/978-981-10-4938-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Mass Metrology
ent://SD_ILS/0/SD_ILS:195336
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Yazar Gupta, S. V. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-23412-5">http://dx.doi.org/10.1007/978-3-642-23412-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optical metrology
ent://SD_ILS/0/SD_ILS:301055
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Yazar Gåsvik, Kjell J. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0470855606">http://dx.doi.org/10.1002/0470855606</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optical metrology
ent://SD_ILS/0/SD_ILS:318819
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Yazar Gåsvik, Kjell J.<br/>Yer Numarası ONLINE(318819.1)<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226</a>
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Speckle metrology
ent://SD_ILS/0/SD_ILS:256067
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Yazar Erf, Robert K.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780122413605">http://www.sciencedirect.com/science/book/9780122413605</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Comprehensive mass metrology
ent://SD_ILS/0/SD_ILS:300541
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Yazar Kochsiek, Manfred. Gläser, Michael, 1942- John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/43419333.html">http://catalog.hathitrust.org/api/volumes/oclc/43419333.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/3527602992">http://dx.doi.org/10.1002/3527602992</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Ultra-fast material metrology
ent://SD_ILS/0/SD_ILS:304932
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Yazar Horn, Alexander, PD Dr.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482071">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482071</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527627929">http://dx.doi.org/10.1002/9783527627929</a>
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Handbook of Metrology and Applications
ent://SD_ILS/0/SD_ILS:528422
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Yazar Aswal, Dinesh K. editor. Yadav, Sanjay. editor. Takatsuji, Toshiyuki. editor. Rachakonda, Prem. editor. Kumar, Harish. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-2074-7">https://doi.org/10.1007/978-981-99-2074-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor strain metrology principles and applications
ent://SD_ILS/0/SD_ILS:280205
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Yazar Wong, Terence K. S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optical imaging and metrology advanced technologies
ent://SD_ILS/0/SD_ILS:306211
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Yazar Osten, Wolfgang. Reingand, Nadya.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://lib.myilibrary.com?id=369321">Connect to MyiLibrary resource.</a>
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Wiley <a href="http://dx.doi.org/10.1002/9783527648443">http://dx.doi.org/10.1002/9783527648443</a>
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Instrumentation and metrology in oceanography
ent://SD_ILS/0/SD_ILS:305395
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Yazar Le Menn, Marc.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ebrary <a href="http://oclc-marc.ebrary.com/Doc?id=10684971">An electronic book accessible through the World Wide Web; click to view</a>
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Information Modeling for Interoperable Dimensional Metrology
ent://SD_ILS/0/SD_ILS:173377
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Yazar Zhao, Yaoyao (Fiona). author. Brown, Robert. author. Kramer, Thomas R. author. Xu, Xun. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-2167-1">http://dx.doi.org/10.1007/978-1-4471-2167-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Springer Handbook of Metrology and Testing
ent://SD_ILS/0/SD_ILS:193364
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Yazar Czichos, Horst. editor. Saito, Tetsuya. editor. Smith, Leslie. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-16641-9">http://dx.doi.org/10.1007/978-3-642-16641-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Software metrics and software metrology
ent://SD_ILS/0/SD_ILS:249319
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Yazar Abran, Alain, 1949-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computational Surface and Roundness Metrology
ent://SD_ILS/0/SD_ILS:175802
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Yazar Muralikrishnan, Bala. author. Raja, Jay. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-297-5">http://dx.doi.org/10.1007/978-1-84800-297-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Metrology for Fire Experiments in Outdoor Conditions
ent://SD_ILS/0/SD_ILS:332373
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Yazar Silvani, Xavier. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332373.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-7962-8">http://dx.doi.org/10.1007/978-1-4614-7962-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications
ent://SD_ILS/0/SD_ILS:195203
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Yazar Raza, Hassan. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-22984-8">http://dx.doi.org/10.1007/978-3-642-22984-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Digital holography for MEMS and microsystem metrology
ent://SD_ILS/0/SD_ILS:305732
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Asundi, Anand.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9781119997290">http://dx.doi.org/10.1002/9781119997290</a>
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<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697681">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697681</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Distributed Large-Scale Dimensional Metrology New Insights
ent://SD_ILS/0/SD_ILS:168531
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Yazar Franceschini, Fiorenzo. author. Galetto, Maurizio. author. Maisano, Domenico. author. Mastrogiacomo, Luca. author. Pralio, Barbara. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-543-9">http://dx.doi.org/10.1007/978-0-85729-543-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in speckle metrology and related techniques
ent://SD_ILS/0/SD_ILS:306059
2026-06-03T01:48:56Z
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Yazar Kaufmann, Guillermo H.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527633852">An electronic book accessible through the World Wide Web; click for information</a>
Wiley InterScience - Full Text Online <a href="http://onlinelibrary.wiley.com/book/10.1002/9783527633852">http://onlinelibrary.wiley.com/book/10.1002/9783527633852</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10446636">http://site.ebrary.com/lib/alltitles/Doc?id=10446636</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Metrology in industry the key for quality
ent://SD_ILS/0/SD_ILS:297585
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Yazar Collège français de métrologie. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470612125">http://dx.doi.org/10.1002/9780470612125</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
ent://SD_ILS/0/SD_ILS:297966
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2026-06-03T01:48:56Z
Yazar International Metrology Conference (13th : 2007 : French College of Metrology) Collège français de métrologie. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470611371">http://dx.doi.org/10.1002/9780470611371</a>
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HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/230183422.html">http://catalog.hathitrust.org/api/volumes/oclc/230183422.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Recent Advances in Metrology Select Proceedings of AdMet 2021
ent://SD_ILS/0/SD_ILS:527491
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2026-06-03T01:48:56Z
Yazar Yadav, Sanjay. editor. Chaudhary, K.P. editor. Gahlot, Ajay. editor. Arya, Yogendra. editor. Dahiya, Aman. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-2468-2">https://doi.org/10.1007/978-981-19-2468-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in Manufacturing II Volume 5 - Metrology and Measurement Systems
ent://SD_ILS/0/SD_ILS:486594
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Diering, Magdalena. editor. Wieczorowski, Michał. editor. Brown, Christopher A. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-18682-1">https://doi.org/10.1007/978-3-030-18682-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Metrology and standardization of nanotechnology : protocols and industrial innovations
ent://SD_ILS/0/SD_ILS:424285
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Yazar Mansfield, Elisabeth, editor. Kaiser, Debra L., editor. Fujita, Daisuke, editor. Voorde, M. H. van de (Marcel H.), editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1002/9783527800308">Wiley Online Library</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fringe pattern analysis for optical metrology : theory, algorithms, and applications
ent://SD_ILS/0/SD_ILS:342225
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.<br/>Yer Numarası ONLINE(342225.1)<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414">http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414</a>
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Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology
ent://SD_ILS/0/SD_ILS:487840
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Osten, Wolfgang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-642-36359-7">https://doi.org/10.1007/978-3-642-36359-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Performance-based gear metrology kinematic-transmission-error computation and diagnosis
ent://SD_ILS/0/SD_ILS:299491
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Mark, William D.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://lib.myilibrary.com?id=449969">Connect to MyiLibrary resource.</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118357903">http://dx.doi.org/10.1002/9781118357903</a>
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Laser metrology in fluid mechanics granulometry, temperature and concentration measurements
ent://SD_ILS/0/SD_ILS:305416
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Boutier, A. (Alain)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1132535">Click here to view book</a>
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Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118576847">http://onlinelibrary.wiley.com/book/10.1002/9781118576847</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118576847">http://dx.doi.org/10.1002/9781118576847</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
A practical guide to optical metrology for thin films
ent://SD_ILS/0/SD_ILS:306262
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Yazar Quinten, Michael.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.msvu.ca:2048/login?url=http://www.msvu.eblib.com/patron/FullRecord.aspx?p=1037093">Check for Full Text</a> Access restricted: MSVU users only
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John Wiley <a href="http://dx.doi.org/10.1002/9783527664344">http://dx.doi.org/10.1002/9783527664344</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
ent://SD_ILS/0/SD_ILS:173624
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Proulx, Tom. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-0228-2">http://dx.doi.org/10.1007/978-1-4614-0228-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocks
ent://SD_ILS/0/SD_ILS:177070
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Hebra, Alexius J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-211-78381-8">http://dx.doi.org/10.1007/978-3-211-78381-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Data Modeling for Metrology and Testing in Measurement Science
ent://SD_ILS/0/SD_ILS:168295
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Pavese, Franco. editor. Forbes, Alistair B. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-8176-4804-6">http://dx.doi.org/10.1007/978-0-8176-4804-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fringe 2009 6th International Workshop on Advanced Optical Metrology
ent://SD_ILS/0/SD_ILS:190503
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Osten, Wolfgang. editor. Kujawinska, Malgorzata. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-03051-2">http://dx.doi.org/10.1007/978-3-642-03051-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Quality Assurance for Chemistry and Environmental Science Metrology from pH Measurement to Nuclear Waste Disposal
ent://SD_ILS/0/SD_ILS:186231
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Meinrath, G. author. Schneider, Petra. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-71273-2">http://dx.doi.org/10.1007/978-3-540-71273-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Microwave Circuit Theory and Foundations of Microwave Metrology
ent://SD_ILS/0/SD_ILS:247770
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Engen, Glenn F.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBEL009E">http://dx.doi.org/10.1049/PBEL009E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Rotating Machinery, Optical Methods & Scanning LDV Methods, Volume 6 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022
ent://SD_ILS/0/SD_ILS:527380
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Di Maio, Dario. editor. Baqersad, Javad. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-04098-6">https://doi.org/10.1007/978-3-031-04098-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in Integrated Design and Production II Proceedings of the 12th International Conference on Integrated Design and Production, CPI 2022, May 10-12, 2022, ENSAM, Rabat, Morocco
ent://SD_ILS/0/SD_ILS:529009
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Azrar, Lahcen. editor. Jalid, Abdelilah. editor. Lamouri, Samir. editor. Siadat, Ali. editor. Taha Janan, Mourad. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-23615-0">https://doi.org/10.1007/978-3-031-23615-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Proceedings of CASICAM 2022
ent://SD_ILS/0/SD_ILS:527455
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Zarbane, Khalid. editor. Beidouri, Zitouni. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-32927-2">https://doi.org/10.1007/978-3-031-32927-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Halal and Kosher Food Integration of Quality and Safety for Global Market Trends
ent://SD_ILS/0/SD_ILS:528625
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Ahmed Osman, Osman. editor. Moneim Elhadi Sulieman, Abdel. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-41459-6">https://doi.org/10.1007/978-3-031-41459-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Clinical and Laboratory Medicine Textbook
ent://SD_ILS/0/SD_ILS:522249
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Ciaccio, Marcello. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-24958-7">https://doi.org/10.1007/978-3-031-24958-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Sensors and Instrumentation, Aircraft/Aerospace and Dynamic Environments Testing, Volume 7 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022
ent://SD_ILS/0/SD_ILS:528173
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Walber, Chad. editor. Stefanski, Matthew. editor. Harvie, Julie. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-05415-0">https://doi.org/10.1007/978-3-031-05415-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Recent Trends in Product Design and Intelligent Manufacturing Systems Select Proceedings of IPDIMS 2021
ent://SD_ILS/0/SD_ILS:528490
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Deepak, B.B.V.L. editor. Bahubalendruni, M.V.A. Raju. editor. Parhi, D.R.K. editor. Biswal, Bibhuti Bhusan. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-4606-6">https://doi.org/10.1007/978-981-19-4606-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Proceedings of the International Conference on Information Control, Electrical Engineering and Rail Transit ICEERT 2022
ent://SD_ILS/0/SD_ILS:528825
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Yadav, Sanjay. editor. Kumar, Rahul. editor. Zainuddin, Hidayat. editor. Deng, Lvxiang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-6431-4">https://doi.org/10.1007/978-981-99-6431-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Digital Holography and Wavefront Sensing Principles, Techniques and Applications
ent://SD_ILS/0/SD_ILS:530368
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Schnars, Ulf. author. Falldorf, Claas. author. Watson, John. author. Jüptner, Werner. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-44693-5">https://doi.org/10.1007/978-3-662-44693-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applications
ent://SD_ILS/0/SD_ILS:518392
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Liu, Zheng. editor. Ukida, Hiroyuki. editor. Ramuhalli, Pradeep. editor. Niel, Kurt. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4471-6741-9">https://doi.org/10.1007/978-1-4471-6741-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Microstructuring of Thermo-Mechanically Highly Stressed Surfaces Final Report of the DFG Research Group 576
ent://SD_ILS/0/SD_ILS:529441
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Denkena, Berend. editor. Rienäcker, Adrian. editor. Knoll, Gunter. editor. Bach, Friedrich-Wilhelm. editor. Maier, Hans Jürgen. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-09692-6">https://doi.org/10.1007/978-3-319-09692-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedings
ent://SD_ILS/0/SD_ILS:519035
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Paredes, Roberto. editor. Cardoso, Jaime S. editor. Pardo, Xosé M. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-19390-8">https://doi.org/10.1007/978-3-319-19390-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Pattern Recognition and Machine Intelligence 6th International Conference, PReMI 2015, Warsaw, Poland, June 30 - July 3, 2015, Proceedings
ent://SD_ILS/0/SD_ILS:519185
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Kryszkiewicz, Marzena. editor. Bandyopadhyay, Sanghamitra. editor. Rybinski, Henryk. editor. Pal, Sankar K. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-19941-2">https://doi.org/10.1007/978-3-319-19941-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applications of EPR in Radiation Research
ent://SD_ILS/0/SD_ILS:530728
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Lund, Anders. editor. Shiotani, Masaru. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-09216-4">https://doi.org/10.1007/978-3-319-09216-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optical devices in ophthalmology and optometry technology, design principles and clinical applications
ent://SD_ILS/0/SD_ILS:342196
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Donnerhacke, Karl-Heinz. Rill, Michael Stefan. Kaschke, Michael F.<br/>Yer Numarası ONLINE(342196.1)<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9783527648962">http://dx.doi.org/10.1002/9783527648962</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Measurements with persons theory, methods, and implementation areas
ent://SD_ILS/0/SD_ILS:262313
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Berglund, Birgitta.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.tandfebooks.com/isbn/9780203816660">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fundamental principles of engineering nanometrology
ent://SD_ILS/0/SD_ILS:145816
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Leach, R. K.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fundamental principles of engineering nanometrology
ent://SD_ILS/0/SD_ILS:355774
2026-06-03T01:48:56Z
2026-06-03T01:48:56Z
Yazar Leach, R. K.<br/>Yer Numarası ONLINE(355774.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781455777532">http://www.sciencedirect.com/science/book/9781455777532</a>
<a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>