Arama Sonu&ccedil;lar&#305; Metrology - Daralt&#305;lm&#305;&#351;: 2006 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMetrology$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092006$0025092006$0026ps$003d300?dt=list 2024-11-29T11:09:33Z X-ray metrology in semiconductor manufacturing ent://SD_ILS/0/SD_ILS:287443 2024-11-29T11:09:33Z 2024-11-29T11:09:33Z Yazar&#160;Bowen, D. Keith (David Keith), 1940-&#160;Tanner, B. K. (Brian Keith)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420005653">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Metrology in industry the key for quality ent://SD_ILS/0/SD_ILS:297585 2024-11-29T11:09:33Z 2024-11-29T11:09:33Z Yazar&#160;Coll&egrave;ge fran&ccedil;ais de m&eacute;trologie.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470612125">http://dx.doi.org/10.1002/9780470612125</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer network time synchronization the network time protocol ent://SD_ILS/0/SD_ILS:291169 2024-11-29T11:09:33Z 2024-11-29T11:09:33Z Yazar&#160;Mills, David L.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420006155">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>