Arama Sonu&ccedil;lar&#305; Metrology - Daralt&#305;lm&#305;&#351;: 2011 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMetrology$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092011$0025092011$0026pe$003dd$00253A$0026ps$003d300?dt=list 2024-12-28T18:07:06Z Information Modeling for Interoperable Dimensional Metrology ent://SD_ILS/0/SD_ILS:173377 2024-12-28T18:07:06Z 2024-12-28T18:07:06Z Yazar&#160;Zhao, Yaoyao (Fiona). author.&#160;Brown, Robert. author.&#160;Kramer, Thomas R. author.&#160;Xu, Xun. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-2167-1">http://dx.doi.org/10.1007/978-1-4471-2167-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Springer Handbook of Metrology and Testing ent://SD_ILS/0/SD_ILS:193364 2024-12-28T18:07:06Z 2024-12-28T18:07:06Z Yazar&#160;Czichos, Horst. editor.&#160;Saito, Tetsuya. editor.&#160;Smith, Leslie. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-16641-9">http://dx.doi.org/10.1007/978-3-642-16641-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Digital holography for MEMS and microsystem metrology ent://SD_ILS/0/SD_ILS:305732 2024-12-28T18:07:06Z 2024-12-28T18:07:06Z Yazar&#160;Asundi, Anand.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781119997290">http://dx.doi.org/10.1002/9781119997290</a> <a href="http://lib.myilibrary.com?id=317798">http://lib.myilibrary.com?id=317798</a> <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697681">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697681</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advances in speckle metrology and related techniques ent://SD_ILS/0/SD_ILS:306059 2024-12-28T18:07:06Z 2024-12-28T18:07:06Z Yazar&#160;Kaufmann, Guillermo H.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527633852">An electronic book accessible through the World Wide Web; click for information</a> Wiley InterScience - Full Text Online <a href="http://onlinelibrary.wiley.com/book/10.1002/9783527633852">http://onlinelibrary.wiley.com/book/10.1002/9783527633852</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10446636">http://site.ebrary.com/lib/alltitles/Doc?id=10446636</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Distributed Large-Scale Dimensional Metrology New Insights ent://SD_ILS/0/SD_ILS:168531 2024-12-28T18:07:06Z 2024-12-28T18:07:06Z Yazar&#160;Franceschini, Fiorenzo. author.&#160;Galetto, Maurizio. author.&#160;Maisano, Domenico. author.&#160;Mastrogiacomo, Luca. author.&#160;Pralio, Barbara. author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-543-9">http://dx.doi.org/10.1007/978-0-85729-543-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics ent://SD_ILS/0/SD_ILS:173624 2024-12-28T18:07:06Z 2024-12-28T18:07:06Z Yazar&#160;Proulx, Tom. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0228-2">http://dx.doi.org/10.1007/978-1-4614-0228-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Handbook of surface and nanometrology ent://SD_ILS/0/SD_ILS:289743 2024-12-28T18:07:06Z 2024-12-28T18:07:06Z Yazar&#160;Whitehouse, D. J. (David J.)&#160;Whitehouse, D. J. (David J.). Handbook of surface metrology.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420082029">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computer network time synchronization the Network Time Protocol on Earth and in space ent://SD_ILS/0/SD_ILS:288795 2024-12-28T18:07:06Z 2024-12-28T18:07:06Z Yazar&#160;Mills, David L.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781439814642">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>