Arama Sonuçları Metrology - Daraltılmış: 2012SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMetrology$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092012$0025092012$0026ps$003d300?dt=list2024-11-22T12:31:43ZMass Metrologyent://SD_ILS/0/SD_ILS:1953362024-11-22T12:31:43Z2024-11-22T12:31:43ZYazar Gupta, S. V. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-23412-5">http://dx.doi.org/10.1007/978-3-642-23412-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Semiconductor strain metrology principles and applicationsent://SD_ILS/0/SD_ILS:2802052024-11-22T12:31:43Z2024-11-22T12:31:43ZYazar Wong, Terence K. S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Instrumentation and metrology in oceanographyent://SD_ILS/0/SD_ILS:3053952024-11-22T12:31:43Z2024-11-22T12:31:43ZYazar Le Menn, Marc.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ebrary <a href="http://oclc-marc.ebrary.com/Doc?id=10684971">An electronic book accessible through the World Wide Web; click to view</a>
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ebrary <a href="http://site.ebrary.com/id/10684971">http://site.ebrary.com/id/10684971</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Optical imaging and metrology advanced technologiesent://SD_ILS/0/SD_ILS:3062112024-11-22T12:31:43Z2024-11-22T12:31:43ZYazar Osten, Wolfgang. Reingand, Nadya.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://lib.myilibrary.com?id=369321">Connect to MyiLibrary resource.</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9783527664344">http://dx.doi.org/10.1002/9783527664344</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>100 years of superconductivityent://SD_ILS/0/SD_ILS:2871152024-11-22T12:31:43Z2024-11-22T12:31:43ZYazar Rogalla, H. (Horst) Kes, P. H. (Peter H.)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439849484">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Measurements with persons theory, methods, and implementation areasent://SD_ILS/0/SD_ILS:2623132024-11-22T12:31:43Z2024-11-22T12:31:43ZYazar Berglund, Birgitta.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.tandfebooks.com/isbn/9780203816660">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Compound semiconductor radiation detectorsent://SD_ILS/0/SD_ILS:2880442024-11-22T12:31:43Z2024-11-22T12:31:43ZYazar Owens, Alan.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439873137">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals of laser micromachiningent://SD_ILS/0/SD_ILS:2852672024-11-22T12:31:43Z2024-11-22T12:31:43ZYazar Schaeffer, Ronald D.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439860564">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Coordinate measuring machines and systemsent://SD_ILS/0/SD_ILS:2894452024-11-22T12:31:43Z2024-11-22T12:31:43ZYazar Hocken, Robert J. Pereira, Paulo H.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420017533">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>