Arama Sonuçları Metrology - Daraltılmış: 2012SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMetrology$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092012$0025092012$0026ps$003d300?dt=list2026-06-02T10:46:28ZMass Metrologyent://SD_ILS/0/SD_ILS:1953362026-06-02T10:46:28Z2026-06-02T10:46:28ZYazar Gupta, S. V. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-23412-5">http://dx.doi.org/10.1007/978-3-642-23412-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Instrumentation and metrology in oceanographyent://SD_ILS/0/SD_ILS:3053952026-06-02T10:46:28Z2026-06-02T10:46:28ZYazar Le Menn, Marc.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ebrary <a href="http://oclc-marc.ebrary.com/Doc?id=10684971">An electronic book accessible through the World Wide Web; click to view</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9781118561959">http://dx.doi.org/10.1002/9781118561959</a>
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ebrary <a href="http://site.ebrary.com/id/10684971">http://site.ebrary.com/id/10684971</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Semiconductor strain metrology principles and applicationsent://SD_ILS/0/SD_ILS:2802052026-06-02T10:46:28Z2026-06-02T10:46:28ZYazar Wong, Terence K. S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Optical imaging and metrology advanced technologiesent://SD_ILS/0/SD_ILS:3062112026-06-02T10:46:28Z2026-06-02T10:46:28ZYazar Osten, Wolfgang. Reingand, Nadya.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://lib.myilibrary.com?id=369321">Connect to MyiLibrary resource.</a>
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Wiley <a href="http://dx.doi.org/10.1002/9783527648443">http://dx.doi.org/10.1002/9783527648443</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10575536">http://site.ebrary.com/lib/alltitles/Doc?id=10575536</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Graphene Nanoelectronics Metrology, Synthesis, Properties and Applicationsent://SD_ILS/0/SD_ILS:1952032026-06-02T10:46:28Z2026-06-02T10:46:28ZYazar Raza, Hassan. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-22984-8">http://dx.doi.org/10.1007/978-3-642-22984-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>A practical guide to optical metrology for thin filmsent://SD_ILS/0/SD_ILS:3062622026-06-02T10:46:28Z2026-06-02T10:46:28ZYazar Quinten, Michael.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.msvu.ca:2048/login?url=http://www.msvu.eblib.com/patron/FullRecord.aspx?p=1037093">Check for Full Text</a> Access restricted: MSVU users only
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John Wiley <a href="http://dx.doi.org/10.1002/9783527664344">http://dx.doi.org/10.1002/9783527664344</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Measurements with persons theory, methods, and implementation areasent://SD_ILS/0/SD_ILS:2623132026-06-02T10:46:28Z2026-06-02T10:46:28ZYazar Berglund, Birgitta.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.tandfebooks.com/isbn/9780203816660">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Coordinate measuring machines and systemsent://SD_ILS/0/SD_ILS:5468122026-06-02T10:46:28Z2026-06-02T10:46:28ZYazar Hocken, Robert J. Pereira, Paulo H.<br/>Yer Numarası TA165.5 .C66 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420017533">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals of laser micromachiningent://SD_ILS/0/SD_ILS:5406252026-06-02T10:46:28Z2026-06-02T10:46:28ZYazar Schaeffer, Ronald D., author.<br/>Yer Numarası TA1675 .S33 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439860564">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>100 years of superconductivityent://SD_ILS/0/SD_ILS:5456112026-06-02T10:46:28Z2026-06-02T10:46:28ZYazar Rogalla, H. (Horst) Kes, P. H. (Peter H.)<br/>Yer Numarası QC611.96 .A16 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439849484">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>