Arama Sonuçları Metrology - Daraltılmış: Optical measurements.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMetrology$0026qf$003dSUBJECT$002509Konu$002509Optical$002bmeasurements.$002509Optical$002bmeasurements.$0026ps$003d300?dt=list
2024-11-22T10:56:47Z
Optical metrology
ent://SD_ILS/0/SD_ILS:318819
2024-11-22T10:56:47Z
2024-11-22T10:56:47Z
Yazar Gåsvik, Kjell J.<br/>Yer Numarası ONLINE(318819.1)<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226</a>
EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=79534">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=79534</a>
MyiLibrary <a href="http://www.myilibrary.com?id=26972">http://www.myilibrary.com?id=26972</a>
John Wiley <a href="http://dx.doi.org/10.1002/0470855606">http://dx.doi.org/10.1002/0470855606</a>
Table of contents <a href="http://catdir.loc.gov/catdir/toc/wiley023/2002072607.html">http://catdir.loc.gov/catdir/toc/wiley023/2002072607.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optical metrology
ent://SD_ILS/0/SD_ILS:301055
2024-11-22T10:56:47Z
2024-11-22T10:56:47Z
Yazar Gåsvik, Kjell J. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0470855606">http://dx.doi.org/10.1002/0470855606</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optical imaging and metrology advanced technologies
ent://SD_ILS/0/SD_ILS:306211
2024-11-22T10:56:47Z
2024-11-22T10:56:47Z
Yazar Osten, Wolfgang. Reingand, Nadya.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://lib.myilibrary.com?id=369321">Connect to MyiLibrary resource.</a>
<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916</a>
Wiley <a href="http://dx.doi.org/10.1002/9783527648443">http://dx.doi.org/10.1002/9783527648443</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10575536">http://site.ebrary.com/lib/alltitles/Doc?id=10575536</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fringe pattern analysis for optical metrology : theory, algorithms, and applications
ent://SD_ILS/0/SD_ILS:342225
2024-11-22T10:56:47Z
2024-11-22T10:56:47Z
Yazar Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.<br/>Yer Numarası ONLINE(342225.1)<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414">http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414</a>
ebrary <a href="http://site.ebrary.com/id/10881255">http://site.ebrary.com/id/10881255</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527681075">http://dx.doi.org/10.1002/9783527681075</a>
MyiLibrary <a href="http://www.myilibrary.com?id=615339">http://www.myilibrary.com?id=615339</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>