Arama Sonuçları Metrology - Daraltılmış: Signal processing.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMetrology$0026qf$003dSUBJECT$002509Konu$002509Signal$002bprocessing.$002509Signal$002bprocessing.$0026ps$003d300$0026isd$003dtrue?
2025-12-31T17:34:08Z
Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology
ent://SD_ILS/0/SD_ILS:487840
2025-12-31T17:34:08Z
2025-12-31T17:34:08Z
Yazar Osten, Wolfgang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-642-36359-7">https://doi.org/10.1007/978-3-642-36359-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Digital Holography and Wavefront Sensing Principles, Techniques and Applications
ent://SD_ILS/0/SD_ILS:530368
2025-12-31T17:34:08Z
2025-12-31T17:34:08Z
Yazar Schnars, Ulf. author. Falldorf, Claas. author. Watson, John. author. Jüptner, Werner. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-44693-5">https://doi.org/10.1007/978-3-662-44693-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>