Arama Sonuçları Metrology.
SirsiDynix Enterprise
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Metrology
ent://SD_ILS/0/SD_ILS:485379
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Yazar Gao, Wei. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-4938-5">https://doi.org/10.1007/978-981-10-4938-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Dimensional metrology
ent://SD_ILS/0/SD_ILS:592197
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Yazar Haitjema, Han, author. Leach, Richard, author.<br/>Yer Numarası QC88<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367821746">https://www.taylorfrancis.com/books/9780367821746</a>
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Mass Metrology
ent://SD_ILS/0/SD_ILS:195336
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Yazar Gupta, S. V. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-23412-5">http://dx.doi.org/10.1007/978-3-642-23412-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optical metrology
ent://SD_ILS/0/SD_ILS:301055
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Yazar Gåsvik, Kjell J. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0470855606">http://dx.doi.org/10.1002/0470855606</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optical metrology
ent://SD_ILS/0/SD_ILS:318819
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Yazar Gåsvik, Kjell J.<br/>Yer Numarası ONLINE(318819.1)<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226</a>
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Speckle metrology
ent://SD_ILS/0/SD_ILS:256067
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Yazar Erf, Robert K.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780122413605">http://www.sciencedirect.com/science/book/9780122413605</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Comprehensive mass metrology
ent://SD_ILS/0/SD_ILS:300541
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Yazar Kochsiek, Manfred. Gläser, Michael, 1942- John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/43419333.html">http://catalog.hathitrust.org/api/volumes/oclc/43419333.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/3527602992">http://dx.doi.org/10.1002/3527602992</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Metrology for engineers
ent://SD_ILS/0/SD_ILS:47424
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Yazar Galyer, J. F. W. Shotbolt, C. R., ort. yaz.<br/>Yer Numarası T 50 G3 1980<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>
ULTRAPRECISION MACHINING AND METROLOGY
ent://SD_ILS/0/SD_ILS:590700
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Yazar Yan, Jiwang.<br/>Yer Numarası QC88<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003292388">https://www.taylorfrancis.com/books/9781003292388</a>
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INTRODUCTION TO OPTICAL METROLOGY
ent://SD_ILS/0/SD_ILS:557177
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Yazar Sirohi, R. S.<br/>Yer Numarası QC367<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003531845">https://www.taylorfrancis.com/books/9781003531845</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Ultra-fast material metrology
ent://SD_ILS/0/SD_ILS:304932
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Yazar Horn, Alexander, PD Dr.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482071">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482071</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527627929">http://dx.doi.org/10.1002/9783527627929</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10332978">http://site.ebrary.com/lib/alltitles/Doc?id=10332978</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of Metrology and Applications
ent://SD_ILS/0/SD_ILS:528422
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Yazar Aswal, Dinesh K. editor. Yadav, Sanjay. editor. Takatsuji, Toshiyuki. editor. Rachakonda, Prem. editor. Kumar, Harish. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-2074-7">https://doi.org/10.1007/978-981-99-2074-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Characterization, testing, measurement, and metrology
ent://SD_ILS/0/SD_ILS:557449
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Yazar Prakash, Chander, editor. Singh, Sunpreet, 1989- editor. Davim, J. Paulo, editor.<br/>Yer Numarası TA410 .C457 2021<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429298073">https://www.taylorfrancis.com/books/9780429298073</a>
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Handbook of optical dimensional metrology
ent://SD_ILS/0/SD_ILS:542598
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Yazar Harding, Kevin G.<br/>Yer Numarası T50 .H268 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439854822">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor strain metrology principles and applications
ent://SD_ILS/0/SD_ILS:280205
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Yazar Wong, Terence K. S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Instrumentation and metrology in oceanography
ent://SD_ILS/0/SD_ILS:305395
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Yazar Le Menn, Marc.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ebrary <a href="http://oclc-marc.ebrary.com/Doc?id=10684971">An electronic book accessible through the World Wide Web; click to view</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9781118561959">http://dx.doi.org/10.1002/9781118561959</a>
Table of contents <a href="http://catdir.loc.gov/catdir/enhancements/fy1303/2012025490-t.html">http://catdir.loc.gov/catdir/enhancements/fy1303/2012025490-t.html</a>
ebrary <a href="http://site.ebrary.com/id/10684971">http://site.ebrary.com/id/10684971</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optical imaging and metrology advanced technologies
ent://SD_ILS/0/SD_ILS:306211
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Yazar Osten, Wolfgang. Reingand, Nadya.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://lib.myilibrary.com?id=369321">Connect to MyiLibrary resource.</a>
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Wiley <a href="http://dx.doi.org/10.1002/9783527648443">http://dx.doi.org/10.1002/9783527648443</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10575536">http://site.ebrary.com/lib/alltitles/Doc?id=10575536</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Springer Handbook of Metrology and Testing
ent://SD_ILS/0/SD_ILS:193364
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Yazar Czichos, Horst. editor. Saito, Tetsuya. editor. Smith, Leslie. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-16641-9">http://dx.doi.org/10.1007/978-3-642-16641-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Information Modeling for Interoperable Dimensional Metrology
ent://SD_ILS/0/SD_ILS:173377
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Yazar Zhao, Yaoyao (Fiona). author. Brown, Robert. author. Kramer, Thomas R. author. Xu, Xun. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-2167-1">http://dx.doi.org/10.1007/978-1-4471-2167-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Software metrics and software metrology
ent://SD_ILS/0/SD_ILS:249319
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Yazar Abran, Alain, 1949-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computational Surface and Roundness Metrology
ent://SD_ILS/0/SD_ILS:175802
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Yazar Muralikrishnan, Bala. author. Raja, Jay. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84800-297-5">http://dx.doi.org/10.1007/978-1-84800-297-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
X-ray metrology in semiconductor manufacturing
ent://SD_ILS/0/SD_ILS:543511
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Yazar Bowen, D. Keith (David Keith), 1940- author. Tanner, B. K. (Brian Keith)<br/>Yer Numarası TK7874.58 .B69 2006<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420005653">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of silicon semiconductor metrology
ent://SD_ILS/0/SD_ILS:547244
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Yazar Diebold, A. C. (Alain C.)<br/>Yer Numarası TK7871.85 .H3337 2001<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135554842">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Metrology for Fire Experiments in Outdoor Conditions
ent://SD_ILS/0/SD_ILS:332373
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Yazar Silvani, Xavier. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(332373.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-7962-8">http://dx.doi.org/10.1007/978-1-4614-7962-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications
ent://SD_ILS/0/SD_ILS:195203
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Yazar Raza, Hassan. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-22984-8">http://dx.doi.org/10.1007/978-3-642-22984-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Digital holography for MEMS and microsystem metrology
ent://SD_ILS/0/SD_ILS:305732
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Yazar Asundi, Anand.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9781119997290">http://dx.doi.org/10.1002/9781119997290</a>
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Advances in speckle metrology and related techniques
ent://SD_ILS/0/SD_ILS:306059
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Yazar Kaufmann, Guillermo H.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527633852">An electronic book accessible through the World Wide Web; click for information</a>
Wiley InterScience - Full Text Online <a href="http://onlinelibrary.wiley.com/book/10.1002/9783527633852">http://onlinelibrary.wiley.com/book/10.1002/9783527633852</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10446636">http://site.ebrary.com/lib/alltitles/Doc?id=10446636</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Distributed Large-Scale Dimensional Metrology New Insights
ent://SD_ILS/0/SD_ILS:168531
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Yazar Franceschini, Fiorenzo. author. Galetto, Maurizio. author. Maisano, Domenico. author. Mastrogiacomo, Luca. author. Pralio, Barbara. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-543-9">http://dx.doi.org/10.1007/978-0-85729-543-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of optical metrology : principles and applications
ent://SD_ILS/0/SD_ILS:540970
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Yazar Yoshizawa, Toru, 1939-<br/>Yer Numarası QC367 .H36 2009<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420019513">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Metrology in industry the key for quality
ent://SD_ILS/0/SD_ILS:297585
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Yazar Collège français de métrologie. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470612125">http://dx.doi.org/10.1002/9780470612125</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
ent://SD_ILS/0/SD_ILS:297966
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Yazar International Metrology Conference (13th : 2007 : French College of Metrology) Collège français de métrologie. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470611371">http://dx.doi.org/10.1002/9780470611371</a>
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HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/230183422.html">http://catalog.hathitrust.org/api/volumes/oclc/230183422.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
High-productivity drilling tools. Materials, metrology, and failure analysis
ent://SD_ILS/0/SD_ILS:582914
2026-01-10T05:09:18Z
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Yazar Astakhov, Viktor P., author.<br/>Yer Numarası TJ1260<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003263319">https://www.taylorfrancis.com/books/9781003263319</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Recent Advances in Metrology Select Proceedings of AdMet 2021
ent://SD_ILS/0/SD_ILS:527491
2026-01-10T05:09:18Z
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Yazar Yadav, Sanjay. editor. Chaudhary, K.P. editor. Gahlot, Ajay. editor. Arya, Yogendra. editor. Dahiya, Aman. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-2468-2">https://doi.org/10.1007/978-981-19-2468-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The economics and science of measurement : a study of metrology
ent://SD_ILS/0/SD_ILS:591504
2026-01-10T05:09:18Z
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Yazar Link, Albert N., author.<br/>Yer Numarası QC91<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003186953">https://www.taylorfrancis.com/books/9781003186953</a>
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Handbook of Laser Technology and Applications Laser Applications: Medical, Metrology and Communication. (Volume Four)
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2026-01-10T05:09:18Z
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Yazar Guo, Chunlei, editor. Singh, Subhash Chandra (Writer on technology), editor.<br/>Yer Numarası TK7871.3<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003130123">https://www.taylorfrancis.com/books/9781003130123</a>
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Advances in Manufacturing II Volume 5 - Metrology and Measurement Systems
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2026-01-10T05:09:18Z
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Yazar Diering, Magdalena. editor. Wieczorowski, Michał. editor. Brown, Christopher A. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-18682-1">https://doi.org/10.1007/978-3-030-18682-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Metrology and standardization of nanotechnology : protocols and industrial innovations
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2026-01-10T05:09:18Z
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Yazar Mansfield, Elisabeth, editor. Kaiser, Debra L., editor. Fujita, Daisuke, editor. Voorde, M. H. van de (Marcel H.), editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1002/9783527800308">Wiley Online Library</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Forensic metrology : scientific measurement and inference for lawyers, judges and criminalists
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Vosk, Ted, author. Emery, A. F. (Ashley Francis), 1934- author.<br/>Yer Numarası HV8073.5 .V67 2015<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439826201">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fringe pattern analysis for optical metrology : theory, algorithms, and applications
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.<br/>Yer Numarası ONLINE(342225.1)<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414">http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414</a>
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Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology
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2026-01-10T05:09:18Z
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Yazar Osten, Wolfgang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-642-36359-7">https://doi.org/10.1007/978-3-642-36359-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Laser metrology in fluid mechanics granulometry, temperature and concentration measurements
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2026-01-10T05:09:18Z
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Yazar Boutier, A. (Alain)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1132535">Click here to view book</a>
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Performance-based gear metrology kinematic-transmission-error computation and diagnosis
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Mark, William D.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://lib.myilibrary.com?id=449969">Connect to MyiLibrary resource.</a>
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Handbook of 3D machine vision : optical metrology and imaging
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Song, Zhang.<br/>Yer Numarası TK8315 .H36 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439872208">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
A practical guide to optical metrology for thin films
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Quinten, Michael.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.msvu.ca:2048/login?url=http://www.msvu.eblib.com/patron/FullRecord.aspx?p=1037093">Check for Full Text</a> Access restricted: MSVU users only
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Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Proulx, Tom. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-0228-2">http://dx.doi.org/10.1007/978-1-4614-0228-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocks
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Hebra, Alexius J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-211-78381-8">http://dx.doi.org/10.1007/978-3-211-78381-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fringe 2009 6th International Workshop on Advanced Optical Metrology
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Osten, Wolfgang. editor. Kujawinska, Malgorzata. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-03051-2">http://dx.doi.org/10.1007/978-3-642-03051-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Data Modeling for Metrology and Testing in Measurement Science
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Pavese, Franco. editor. Forbes, Alistair B. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-8176-4804-6">http://dx.doi.org/10.1007/978-0-8176-4804-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Quality Assurance for Chemistry and Environmental Science Metrology from pH Measurement to Nuclear Waste Disposal
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Meinrath, G. author. Schneider, Petra. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-71273-2">http://dx.doi.org/10.1007/978-3-540-71273-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Microwave Circuit Theory and Foundations of Microwave Metrology
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Engen, Glenn F.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBEL009E">http://dx.doi.org/10.1049/PBEL009E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of surface and nanometrology
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2026-01-10T05:09:18Z
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Yazar Whitehouse, D. J. (David J.), author. Whitehouse, D. J. (David J.). Handbook of surface metrology.<br/>Yer Numarası TA418.7 .W47 2011<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420082029">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of surface and nanometrology
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Whitehouse, D. J. (David J.), author. Whitehouse, D. J. (David J.). Handbook of surface metrology.<br/>Yer Numarası TA418.7 .W45 2003<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420034196">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer vision & laser vibrometry. Volume 6
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar International Modal Analysis Conference (41st : 2023) Baqersad, Javad, editor. Di Maio, Dario, editor.<br/>Yer Numarası TA1634 .I58 2023 EB<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9788743804123">https://www.taylorfrancis.com/books/9788743804123</a>
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Rotating Machinery, Optical Methods & Scanning LDV Methods, Volume 6 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Di Maio, Dario. editor. Baqersad, Javad. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-04098-6">https://doi.org/10.1007/978-3-031-04098-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Proceedings of the International Conference on Information Control, Electrical Engineering and Rail Transit ICEERT 2022
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Yadav, Sanjay. editor. Kumar, Rahul. editor. Zainuddin, Hidayat. editor. Deng, Lvxiang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-6431-4">https://doi.org/10.1007/978-981-99-6431-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Recent Trends in Product Design and Intelligent Manufacturing Systems Select Proceedings of IPDIMS 2021
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Deepak, B.B.V.L. editor. Bahubalendruni, M.V.A. Raju. editor. Parhi, D.R.K. editor. Biswal, Bibhuti Bhusan. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-19-4606-6">https://doi.org/10.1007/978-981-19-4606-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Halal and Kosher Food Integration of Quality and Safety for Global Market Trends
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Ahmed Osman, Osman. editor. Moneim Elhadi Sulieman, Abdel. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-41459-6">https://doi.org/10.1007/978-3-031-41459-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Clinical and Laboratory Medicine Textbook
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Ciaccio, Marcello. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-24958-7">https://doi.org/10.1007/978-3-031-24958-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in Integrated Design and Production II Proceedings of the 12th International Conference on Integrated Design and Production, CPI 2022, May 10-12, 2022, ENSAM, Rabat, Morocco
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2026-01-10T05:09:18Z
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Yazar Azrar, Lahcen. editor. Jalid, Abdelilah. editor. Lamouri, Samir. editor. Siadat, Ali. editor. Taha Janan, Mourad. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-23615-0">https://doi.org/10.1007/978-3-031-23615-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Proceedings of CASICAM 2022
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Zarbane, Khalid. editor. Beidouri, Zitouni. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-32927-2">https://doi.org/10.1007/978-3-031-32927-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Sensors and Instrumentation, Aircraft/Aerospace and Dynamic Environments Testing, Volume 7 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Walber, Chad. editor. Stefanski, Matthew. editor. Harvie, Julie. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-05415-0">https://doi.org/10.1007/978-3-031-05415-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applications
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Liu, Zheng. editor. Ukida, Hiroyuki. editor. Ramuhalli, Pradeep. editor. Niel, Kurt. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4471-6741-9">https://doi.org/10.1007/978-1-4471-6741-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Microstructuring of Thermo-Mechanically Highly Stressed Surfaces Final Report of the DFG Research Group 576
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Denkena, Berend. editor. Rienäcker, Adrian. editor. Knoll, Gunter. editor. Bach, Friedrich-Wilhelm. editor. Maier, Hans Jürgen. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-09692-6">https://doi.org/10.1007/978-3-319-09692-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Pattern Recognition and Machine Intelligence 6th International Conference, PReMI 2015, Warsaw, Poland, June 30 - July 3, 2015, Proceedings
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Kryszkiewicz, Marzena. editor. Bandyopadhyay, Sanghamitra. editor. Rybinski, Henryk. editor. Pal, Sankar K. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-19941-2">https://doi.org/10.1007/978-3-319-19941-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedings
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Paredes, Roberto. editor. Cardoso, Jaime S. editor. Pardo, Xosé M. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-19390-8">https://doi.org/10.1007/978-3-319-19390-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Digital Holography and Wavefront Sensing Principles, Techniques and Applications
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Schnars, Ulf. author. Falldorf, Claas. author. Watson, John. author. Jüptner, Werner. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-662-44693-5">https://doi.org/10.1007/978-3-662-44693-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optical devices in ophthalmology and optometry technology, design principles and clinical applications
ent://SD_ILS/0/SD_ILS:342196
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Donnerhacke, Karl-Heinz. Rill, Michael Stefan. Kaschke, Michael F.<br/>Yer Numarası ONLINE(342196.1)<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9783527648962">http://dx.doi.org/10.1002/9783527648962</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applications of EPR in Radiation Research
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Lund, Anders. editor. Shiotani, Masaru. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-09216-4">https://doi.org/10.1007/978-3-319-09216-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Drills : science and technology of advanced operations
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Astakhov, Viktor P., author.<br/>Yer Numarası TJ1260 .A87 2014<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781466584358">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electrical impedance : principles, measurement, and applications
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2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Callegaro, Luca., author.<br/>Yer Numarası QC522 .C35 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439849118">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Luminescence : the instrumental key to the future of nanotechnology
ent://SD_ILS/0/SD_ILS:545621
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Gilmore, Adam M., editor.<br/>Yer Numarası QC476.5 .L86 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9789814267724">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Yasal metroloji
ent://SD_ILS/0/SD_ILS:340257
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yer Numarası QC89.T9 Y37 2013<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>
100 years of superconductivity
ent://SD_ILS/0/SD_ILS:545611
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Rogalla, H. (Horst) Kes, P. H. (Peter H.)<br/>Yer Numarası QC611.96 .A16 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439849484">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Measurements with persons theory, methods, and implementation areas
ent://SD_ILS/0/SD_ILS:262313
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Berglund, Birgitta.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.tandfebooks.com/isbn/9780203816660">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fundamentals of laser micromachining
ent://SD_ILS/0/SD_ILS:540625
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Schaeffer, Ronald D., author.<br/>Yer Numarası TA1675 .S33 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439860564">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Coordinate measuring machines and systems
ent://SD_ILS/0/SD_ILS:546812
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Hocken, Robert J. Pereira, Paulo H.<br/>Yer Numarası TA165.5 .C66 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420017533">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer network time synchronization : the Network Time Protocol on Earth and in space
ent://SD_ILS/0/SD_ILS:546468
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Mills, David L., author.<br/>Yer Numarası TK5105.575 .M55 2011<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315218151">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of photonics for biomedical science
ent://SD_ILS/0/SD_ILS:547675
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Tuchin, V. V. (Valerii Viktorovich)<br/>Yer Numarası R857 .O6 H366 2010<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439806296">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fundamental principles of engineering nanometrology
ent://SD_ILS/0/SD_ILS:355774
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Leach, R. K.<br/>Yer Numarası ONLINE(355774.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781455777532">http://www.sciencedirect.com/science/book/9781455777532</a>
<a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Fundamental principles of engineering nanometrology
ent://SD_ILS/0/SD_ILS:145816
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Leach, R. K.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Microcomputed tomography : methodology and applications
ent://SD_ILS/0/SD_ILS:542480
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Stock, Stuart R., author.<br/>Yer Numarası RC78.7 .T6 S73 2009<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420058772">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of semiconductor manufacturing technology
ent://SD_ILS/0/SD_ILS:542441
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Doering, Robert, 1946- Nishi, Yoshio, 1940-<br/>Yer Numarası TK7871.85 .H3335 2008<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315213934">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Microlithography : science and technology
ent://SD_ILS/0/SD_ILS:542483
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Suzuki, Kazuaki. Smith, Bruce W., 1959-<br/>Yer Numarası TK7836 .M525 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420051537">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optical inspection of microsystems
ent://SD_ILS/0/SD_ILS:542500
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Osten, Wolfgang.<br/>Yer Numarası TS156.2 .O652 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420019162">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Financial justification of nondestructive testing : cost of quality in manufacturing
ent://SD_ILS/0/SD_ILS:542923
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Papadakis, Emmanuel P., author.<br/>Yer Numarası TA417.2 .P37 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420009705">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Solid-state lasers and applications
ent://SD_ILS/0/SD_ILS:544504
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Sennaroglu, Alphan.<br/>Yer Numarası TA1705 .S6748 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315222059">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer network time synchronization : the network time protocol
ent://SD_ILS/0/SD_ILS:540821
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Mills, David L., author.<br/>Yer Numarası TK5105.5 .M564 2006<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420006155">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of photomask manufacturing technology
ent://SD_ILS/0/SD_ILS:546491
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Rizvi, Syed.<br/>Yer Numarası TK7872 .M3 H36 2005<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420028782">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of Laser Technology and Applications (Three- Volume Set).
ent://SD_ILS/0/SD_ILS:541050
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Taylor and Francis.<br/>Yer Numarası TA1675 .H363 2003<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/e/9781420050530">Click here to view.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Practical density measurement and hydrometry
ent://SD_ILS/0/SD_ILS:544551
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Gupta, S. V., author.<br/>Yer Numarası QD169 .W3<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367801496">https://www.taylorfrancis.com/books/9780367801496</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Evaluating the measurement uncertainty : fundamentals and practical guidance
ent://SD_ILS/0/SD_ILS:538556
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Lira, Ignacio, 1951- author.<br/>Yer Numarası T50<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367801564">https://www.taylorfrancis.com/books/9780367801564</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of mass measurement
ent://SD_ILS/0/SD_ILS:545921
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Jones, Frank E., author. Schoonover, Randall M.<br/>Yer Numarası QC106 .J66 2002<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420038453">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of optical engineering
ent://SD_ILS/0/SD_ILS:542246
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Malacara, Daniel, 1937- Thompson, Brian J.<br/>Yer Numarası TA1520 .H368 2001<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135556525">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Assessment of Oral Health : Diagnostic Techniques and Validation Criteria
ent://SD_ILS/0/SD_ILS:548684
2026-01-10T05:09:18Z
2026-01-10T05:09:18Z
Yazar Faller, R.V., editor.<br/>Yer Numarası XX(548684.1)<br/>Elektronik Erişim <a href="https://karger.com/book/doi/10.1159/isbn.978-3-318-00549-3">https://karger.com/book/doi/10.1159/isbn.978-3-318-00549-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>