Arama Sonu&ccedil;lar&#305; Metrology. - Daralt&#305;lm&#305;&#351;: SpringerLink (Online service) SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMetrology.$0026qf$003dAUTHOR$002509Yazar$002509SpringerLink$002b$002528Online$002bservice$002529$002509SpringerLink$002b$002528Online$002bservice$002529$0026ps$003d300? 2024-11-11T23:05:51Z Metrology ent://SD_ILS/0/SD_ILS:485379 2024-11-11T23:05:51Z 2024-11-11T23:05:51Z Yazar&#160;Gao, Wei. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-981-10-4938-5">https://doi.org/10.1007/978-981-10-4938-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mass Metrology ent://SD_ILS/0/SD_ILS:195336 2024-11-11T23:05:51Z 2024-11-11T23:05:51Z Yazar&#160;Gupta, S. V. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-23412-5">http://dx.doi.org/10.1007/978-3-642-23412-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Information Modeling for Interoperable Dimensional Metrology ent://SD_ILS/0/SD_ILS:173377 2024-11-11T23:05:51Z 2024-11-11T23:05:51Z Yazar&#160;Zhao, Yaoyao (Fiona). author.&#160;Brown, Robert. author.&#160;Kramer, Thomas R. author.&#160;Xu, Xun. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4471-2167-1">http://dx.doi.org/10.1007/978-1-4471-2167-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Springer Handbook of Metrology and Testing ent://SD_ILS/0/SD_ILS:193364 2024-11-11T23:05:51Z 2024-11-11T23:05:51Z Yazar&#160;Czichos, Horst. editor.&#160;Saito, Tetsuya. editor.&#160;Smith, Leslie. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-16641-9">http://dx.doi.org/10.1007/978-3-642-16641-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computational Surface and Roundness Metrology ent://SD_ILS/0/SD_ILS:175802 2024-11-11T23:05:51Z 2024-11-11T23:05:51Z Yazar&#160;Muralikrishnan, Bala. author.&#160;Raja, Jay. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-84800-297-5">http://dx.doi.org/10.1007/978-1-84800-297-5</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Metrology for Fire Experiments in Outdoor Conditions ent://SD_ILS/0/SD_ILS:332373 2024-11-11T23:05:51Z 2024-11-11T23:05:51Z Yazar&#160;Silvani, Xavier. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE(332373.1)<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-7962-8">http://dx.doi.org/10.1007/978-1-4614-7962-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications ent://SD_ILS/0/SD_ILS:195203 2024-11-11T23:05:51Z 2024-11-11T23:05:51Z Yazar&#160;Raza, Hassan. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-22984-8">http://dx.doi.org/10.1007/978-3-642-22984-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Distributed Large-Scale Dimensional Metrology New Insights ent://SD_ILS/0/SD_ILS:168531 2024-11-11T23:05:51Z 2024-11-11T23:05:51Z Yazar&#160;Franceschini, Fiorenzo. author.&#160;Galetto, Maurizio. author.&#160;Maisano, Domenico. author.&#160;Mastrogiacomo, Luca. author.&#160;Pralio, Barbara. author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-543-9">http://dx.doi.org/10.1007/978-0-85729-543-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Advances in Manufacturing II Volume 5 - Metrology and Measurement Systems ent://SD_ILS/0/SD_ILS:486594 2024-11-11T23:05:51Z 2024-11-11T23:05:51Z Yazar&#160;Diering, Magdalena. editor.&#160;Wieczorowski, Micha&#322;. editor.&#160;Brown, Christopher A. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-030-18682-1">https://doi.org/10.1007/978-3-030-18682-1</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology ent://SD_ILS/0/SD_ILS:487840 2024-11-11T23:05:51Z 2024-11-11T23:05:51Z Yazar&#160;Osten, Wolfgang. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-642-36359-7">https://doi.org/10.1007/978-3-642-36359-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics ent://SD_ILS/0/SD_ILS:173624 2024-11-11T23:05:51Z 2024-11-11T23:05:51Z Yazar&#160;Proulx, Tom. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-0228-2">http://dx.doi.org/10.1007/978-1-4614-0228-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocks ent://SD_ILS/0/SD_ILS:177070 2024-11-11T23:05:51Z 2024-11-11T23:05:51Z Yazar&#160;Hebra, Alexius J. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-211-78381-8">http://dx.doi.org/10.1007/978-3-211-78381-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Data Modeling for Metrology and Testing in Measurement Science ent://SD_ILS/0/SD_ILS:168295 2024-11-11T23:05:51Z 2024-11-11T23:05:51Z Yazar&#160;Pavese, Franco. editor.&#160;Forbes, Alistair B. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-0-8176-4804-6">http://dx.doi.org/10.1007/978-0-8176-4804-6</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fringe 2009 6th International Workshop on Advanced Optical Metrology ent://SD_ILS/0/SD_ILS:190503 2024-11-11T23:05:51Z 2024-11-11T23:05:51Z Yazar&#160;Osten, Wolfgang. editor.&#160;Kujawinska, Malgorzata. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-642-03051-2">http://dx.doi.org/10.1007/978-3-642-03051-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Quality Assurance for Chemistry and Environmental Science Metrology from pH Measurement to Nuclear Waste Disposal ent://SD_ILS/0/SD_ILS:186231 2024-11-11T23:05:51Z 2024-11-11T23:05:51Z Yazar&#160;Meinrath, G. author.&#160;Schneider, Petra. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1007/978-3-540-71273-2">http://dx.doi.org/10.1007/978-3-540-71273-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Clinical and Laboratory Medicine Textbook ent://SD_ILS/0/SD_ILS:522249 2024-11-11T23:05:51Z 2024-11-11T23:05:51Z Yazar&#160;Ciaccio, Marcello. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;XX(522249.1)<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-24958-7">https://doi.org/10.1007/978-3-031-24958-7</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedings ent://SD_ILS/0/SD_ILS:519035 2024-11-11T23:05:51Z 2024-11-11T23:05:51Z Yazar&#160;Paredes, Roberto. editor.&#160;Cardoso, Jaime S. editor.&#160;Pardo, Xos&eacute; M. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;XX(519035.1)<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-19390-8">https://doi.org/10.1007/978-3-319-19390-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Pattern Recognition and Machine Intelligence 6th International Conference, PReMI 2015, Warsaw, Poland, June 30 - July 3, 2015, Proceedings ent://SD_ILS/0/SD_ILS:519185 2024-11-11T23:05:51Z 2024-11-11T23:05:51Z Yazar&#160;Kryszkiewicz, Marzena. editor.&#160;Bandyopadhyay, Sanghamitra. editor.&#160;Rybinski, Henryk. editor.&#160;Pal, Sankar K. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;XX(519185.1)<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-19941-2">https://doi.org/10.1007/978-3-319-19941-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applications ent://SD_ILS/0/SD_ILS:518392 2024-11-11T23:05:51Z 2024-11-11T23:05:51Z Yazar&#160;Liu, Zheng. editor.&#160;Ukida, Hiroyuki. editor.&#160;Ramuhalli, Pradeep. editor.&#160;Niel, Kurt. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;XX(518392.1)<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-1-4471-6741-9">https://doi.org/10.1007/978-1-4471-6741-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>