Arama Sonuçları Metrology. - Daraltılmış: Elektronik KütüphaneSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMetrology.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Elektronik$002bK$0025C3$0025BCt$0025C3$0025BCphane$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?dt=list2024-12-26T12:52:59ZMetrologyent://SD_ILS/0/SD_ILS:4853792024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Gao, Wei. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-10-4938-5">https://doi.org/10.1007/978-981-10-4938-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mass Metrologyent://SD_ILS/0/SD_ILS:1953362024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Gupta, S. V. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-23412-5">http://dx.doi.org/10.1007/978-3-642-23412-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Optical metrologyent://SD_ILS/0/SD_ILS:3010552024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Gåsvik, Kjell J. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0470855606">http://dx.doi.org/10.1002/0470855606</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Optical metrologyent://SD_ILS/0/SD_ILS:3188192024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Gåsvik, Kjell J.<br/>Yer Numarası ONLINE(318819.1)<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9783527664344">http://dx.doi.org/10.1002/9783527664344</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanicsent://SD_ILS/0/SD_ILS:1736242024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Proulx, Tom. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-0228-2">http://dx.doi.org/10.1007/978-1-4614-0228-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocksent://SD_ILS/0/SD_ILS:1770702024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Hebra, Alexius J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-211-78381-8">http://dx.doi.org/10.1007/978-3-211-78381-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Data Modeling for Metrology and Testing in Measurement Scienceent://SD_ILS/0/SD_ILS:1682952024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Pavese, Franco. editor. Forbes, Alistair B. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-8176-4804-6">http://dx.doi.org/10.1007/978-0-8176-4804-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fringe 2009 6th International Workshop on Advanced Optical Metrologyent://SD_ILS/0/SD_ILS:1905032024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Osten, Wolfgang. editor. Kujawinska, Malgorzata. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-03051-2">http://dx.doi.org/10.1007/978-3-642-03051-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quality Assurance for Chemistry and Environmental Science Metrology from pH Measurement to Nuclear Waste Disposalent://SD_ILS/0/SD_ILS:1862312024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Meinrath, G. author. Schneider, Petra. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-71273-2">http://dx.doi.org/10.1007/978-3-540-71273-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Microwave Circuit Theory and Foundations of Microwave Metrologyent://SD_ILS/0/SD_ILS:2477702024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Engen, Glenn F.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBEL009E">http://dx.doi.org/10.1049/PBEL009E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of surface and nanometrologyent://SD_ILS/0/SD_ILS:2897432024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Whitehouse, D. J. (David J.) Whitehouse, D. J. (David J.). Handbook of surface metrology.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420082029">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of surface and nanometrologyent://SD_ILS/0/SD_ILS:2858652024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Whitehouse, D. J. (David J.) Whitehouse, D. J. (David J.). Handbook of surface metrology.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420034196">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Clinical and Laboratory Medicine Textbookent://SD_ILS/0/SD_ILS:5222492024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Ciaccio, Marcello. editor. SpringerLink (Online service)<br/>Yer Numarası XX(522249.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-24958-7">https://doi.org/10.1007/978-3-031-24958-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applicationsent://SD_ILS/0/SD_ILS:5183922024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Liu, Zheng. editor. Ukida, Hiroyuki. editor. Ramuhalli, Pradeep. editor. Niel, Kurt. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518392.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4471-6741-9">https://doi.org/10.1007/978-1-4471-6741-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pattern Recognition and Machine Intelligence 6th International Conference, PReMI 2015, Warsaw, Poland, June 30 - July 3, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5191852024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Kryszkiewicz, Marzena. editor. Bandyopadhyay, Sanghamitra. editor. Rybinski, Henryk. editor. Pal, Sankar K. editor. SpringerLink (Online service)<br/>Yer Numarası XX(519185.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-19941-2">https://doi.org/10.1007/978-3-319-19941-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5190352024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Paredes, Roberto. editor. Cardoso, Jaime S. editor. Pardo, Xosé M. editor. SpringerLink (Online service)<br/>Yer Numarası XX(519035.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-19390-8">https://doi.org/10.1007/978-3-319-19390-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Optical devices in ophthalmology and optometry technology, design principles and clinical applicationsent://SD_ILS/0/SD_ILS:3421962024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Donnerhacke, Karl-Heinz. Rill, Michael Stefan. Kaschke, Michael F.<br/>Yer Numarası ONLINE(342196.1)<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9783527648962">http://dx.doi.org/10.1002/9783527648962</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Electrical impedance principles, measurement, and applicationsent://SD_ILS/0/SD_ILS:2899632024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Callegaro, Luca.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439849118">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Measurements with persons theory, methods, and implementation areasent://SD_ILS/0/SD_ILS:2623132024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Berglund, Birgitta.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.tandfebooks.com/isbn/9780203816660">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Coordinate measuring machines and systemsent://SD_ILS/0/SD_ILS:2894452024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Hocken, Robert J. Pereira, Paulo H.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420017533">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals of laser micromachiningent://SD_ILS/0/SD_ILS:2852672024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Schaeffer, Ronald D.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439860564">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>100 years of superconductivityent://SD_ILS/0/SD_ILS:2871152024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Rogalla, H. (Horst) Kes, P. H. (Peter H.)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439849484">Distributed by publisher. 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Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of photonics for biomedical scienceent://SD_ILS/0/SD_ILS:2906732024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Tuchin, V. V. (Valeri? Viktorovich)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439806296">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamental principles of engineering nanometrologyent://SD_ILS/0/SD_ILS:1458162024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Leach, R. K.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamental principles of engineering nanometrologyent://SD_ILS/0/SD_ILS:3557742024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Leach, R. K.<br/>Yer Numarası ONLINE(355774.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781455777532">http://www.sciencedirect.com/science/book/9781455777532</a>
<a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer network time synchronization the network time protocolent://SD_ILS/0/SD_ILS:2911692024-12-26T12:52:59Z2024-12-26T12:52:59ZYazar Mills, David L.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420006155">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>