Arama Sonuçları Metrology. - Daraltılmış: 2006SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMetrology.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092006$0025092006$0026ps$003d300$0026isd$003dtrue?2024-09-23T02:25:43ZX-ray metrology in semiconductor manufacturingent://SD_ILS/0/SD_ILS:2874432024-09-23T02:25:43Z2024-09-23T02:25:43ZYazar Bowen, D. Keith (David Keith), 1940- Tanner, B. K. (Brian Keith)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420005653">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Metrology in industry the key for qualityent://SD_ILS/0/SD_ILS:2975852024-09-23T02:25:43Z2024-09-23T02:25:43ZYazar Collège français de métrologie. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470612125">http://dx.doi.org/10.1002/9780470612125</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer network time synchronization the network time protocolent://SD_ILS/0/SD_ILS:2911692024-09-23T02:25:43Z2024-09-23T02:25:43ZYazar Mills, David L.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420006155">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>