Arama Sonuçları Metrology. - Daraltılmış: 2011SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMetrology.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092011$0025092011$0026te$003dILS$0026ps$003d300?dt=list2024-12-26T01:01:01ZSpringer Handbook of Metrology and Testingent://SD_ILS/0/SD_ILS:1933642024-12-26T01:01:01Z2024-12-26T01:01:01ZYazar Czichos, Horst. editor. Saito, Tetsuya. editor. Smith, Leslie. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-16641-9">http://dx.doi.org/10.1007/978-3-642-16641-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Information Modeling for Interoperable Dimensional Metrologyent://SD_ILS/0/SD_ILS:1733772024-12-26T01:01:01Z2024-12-26T01:01:01ZYazar Zhao, Yaoyao (Fiona). author. Brown, Robert. author. Kramer, Thomas R. author. Xu, Xun. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-2167-1">http://dx.doi.org/10.1007/978-1-4471-2167-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Digital holography for MEMS and microsystem metrologyent://SD_ILS/0/SD_ILS:3057322024-12-26T01:01:01Z2024-12-26T01:01:01ZYazar Asundi, Anand.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9781119997290">http://dx.doi.org/10.1002/9781119997290</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10446636">http://site.ebrary.com/lib/alltitles/Doc?id=10446636</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Distributed Large-Scale Dimensional Metrology New Insightsent://SD_ILS/0/SD_ILS:1685312024-12-26T01:01:01Z2024-12-26T01:01:01ZYazar Franceschini, Fiorenzo. author. Galetto, Maurizio. author. Maisano, Domenico. author. Mastrogiacomo, Luca. author. Pralio, Barbara. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-543-9">http://dx.doi.org/10.1007/978-0-85729-543-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanicsent://SD_ILS/0/SD_ILS:1736242024-12-26T01:01:01Z2024-12-26T01:01:01ZYazar Proulx, Tom. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-0228-2">http://dx.doi.org/10.1007/978-1-4614-0228-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of surface and nanometrologyent://SD_ILS/0/SD_ILS:2897432024-12-26T01:01:01Z2024-12-26T01:01:01ZYazar Whitehouse, D. J. (David J.) Whitehouse, D. J. (David J.). Handbook of surface metrology.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420082029">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computer network time synchronization the Network Time Protocol on Earth and in spaceent://SD_ILS/0/SD_ILS:2887952024-12-26T01:01:01Z2024-12-26T01:01:01ZYazar Mills, David L.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439814642">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>