Arama Sonuçları Metrology. - Daraltılmış: Electronic books.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMetrology.$0026qf$003dSUBJECT$002509Konu$002509Electronic$002bbooks.$002509Electronic$002bbooks.$0026ps$003d300?dt=list
2024-11-22T09:51:35Z
Ultra-fast material metrology
ent://SD_ILS/0/SD_ILS:304932
2024-11-22T09:51:35Z
2024-11-22T09:51:35Z
Yazar Horn, Alexander, PD Dr.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482071">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482071</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527627929">http://dx.doi.org/10.1002/9783527627929</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10332978">http://site.ebrary.com/lib/alltitles/Doc?id=10332978</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Optical imaging and metrology advanced technologies
ent://SD_ILS/0/SD_ILS:306211
2024-11-22T09:51:35Z
2024-11-22T09:51:35Z
Yazar Osten, Wolfgang. Reingand, Nadya.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://lib.myilibrary.com?id=369321">Connect to MyiLibrary resource.</a>
<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916</a>
Wiley <a href="http://dx.doi.org/10.1002/9783527648443">http://dx.doi.org/10.1002/9783527648443</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10575536">http://site.ebrary.com/lib/alltitles/Doc?id=10575536</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Software metrics and software metrology
ent://SD_ILS/0/SD_ILS:249319
2024-11-22T09:51:35Z
2024-11-22T09:51:35Z
Yazar Abran, Alain, 1949-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in speckle metrology and related techniques
ent://SD_ILS/0/SD_ILS:306059
2024-11-22T09:51:35Z
2024-11-22T09:51:35Z
Yazar Kaufmann, Guillermo H.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527633852">An electronic book accessible through the World Wide Web; click for information</a>
Wiley InterScience - Full Text Online <a href="http://onlinelibrary.wiley.com/book/10.1002/9783527633852">http://onlinelibrary.wiley.com/book/10.1002/9783527633852</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10446636">http://site.ebrary.com/lib/alltitles/Doc?id=10446636</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
ent://SD_ILS/0/SD_ILS:297966
2024-11-22T09:51:35Z
2024-11-22T09:51:35Z
Yazar International Metrology Conference (13th : 2007 : French College of Metrology) Collège français de métrologie. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470611371">http://dx.doi.org/10.1002/9780470611371</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10360928">http://site.ebrary.com/lib/alltitles/Doc?id=10360928</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=477706">http://swb.eblib.com/patron/FullRecord.aspx?p=477706</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/230183422.html">http://catalog.hathitrust.org/api/volumes/oclc/230183422.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Performance-based gear metrology kinematic-transmission-error computation and diagnosis
ent://SD_ILS/0/SD_ILS:299491
2024-11-22T09:51:35Z
2024-11-22T09:51:35Z
Yazar Mark, William D.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://lib.myilibrary.com?id=449969">Connect to MyiLibrary resource.</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118357903">http://dx.doi.org/10.1002/9781118357903</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=51229">http://www.books24x7.com/marc.asp?bookid=51229</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
A practical guide to optical metrology for thin films
ent://SD_ILS/0/SD_ILS:306262
2024-11-22T09:51:35Z
2024-11-22T09:51:35Z
Yazar Quinten, Michael.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://www.msvu.ca:2048/login?url=http://www.msvu.eblib.com/patron/FullRecord.aspx?p=1037093">Check for Full Text</a> Access restricted: MSVU users only
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1037093">Click here to view book</a>
<a href="http://lib.myilibrary.com?id=478849">Connect to MyiLibrary resource.</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527664344">http://dx.doi.org/10.1002/9783527664344</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>