Arama Sonuçları Metrology. - Daraltılmış: Metrology.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMetrology.$0026qf$003dSUBJECT$002509Konu$002509Metrology.$002509Metrology.$0026ps$003d300$0026isd$003dtrue?dt=list2024-11-25T07:04:00ZUltra-fast material metrologyent://SD_ILS/0/SD_ILS:3049322024-11-25T07:04:00Z2024-11-25T07:04:00ZYazar Horn, Alexander, PD Dr.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482071">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482071</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527627929">http://dx.doi.org/10.1002/9783527627929</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10332978">http://site.ebrary.com/lib/alltitles/Doc?id=10332978</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Optical imaging and metrology advanced technologiesent://SD_ILS/0/SD_ILS:3062112024-11-25T07:04:00Z2024-11-25T07:04:00ZYazar Osten, Wolfgang. Reingand, Nadya.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://lib.myilibrary.com?id=369321">Connect to MyiLibrary resource.</a>
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Wiley <a href="http://dx.doi.org/10.1002/9783527648443">http://dx.doi.org/10.1002/9783527648443</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10575536">http://site.ebrary.com/lib/alltitles/Doc?id=10575536</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Metrology in industry the key for qualityent://SD_ILS/0/SD_ILS:2975852024-11-25T07:04:00Z2024-11-25T07:04:00ZYazar Collège français de métrologie. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470612125">http://dx.doi.org/10.1002/9780470612125</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Metrology and standardization of nanotechnology : protocols and industrial innovationsent://SD_ILS/0/SD_ILS:4242852024-11-25T07:04:00Z2024-11-25T07:04:00ZYazar Mansfield, Elisabeth, editor. Kaiser, Debra L., editor. Fujita, Daisuke, editor. Voorde, M. H. van de (Marcel H.), editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1002/9783527800308">Wiley Online Library</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Forensic metrology : scientific measurement and inference for lawyers, judges and criminalistsent://SD_ILS/0/SD_ILS:3571512024-11-25T07:04:00Z2024-11-25T07:04:00ZYazar Vosk, Ted, author. Emery, A. F. (Ashley Francis), 1934- author.<br/>Yer Numarası ONLINE(357151.1)<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439826201">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Laser metrology in fluid mechanics granulometry, temperature and concentration measurementsent://SD_ILS/0/SD_ILS:3054162024-11-25T07:04:00Z2024-11-25T07:04:00ZYazar Boutier, A. (Alain)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1132535">Click here to view book</a>
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Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118576847">http://onlinelibrary.wiley.com/book/10.1002/9781118576847</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118576847">http://dx.doi.org/10.1002/9781118576847</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamental principles of engineering nanometrologyent://SD_ILS/0/SD_ILS:1458162024-11-25T07:04:00Z2024-11-25T07:04:00ZYazar Leach, R. K.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamental principles of engineering nanometrologyent://SD_ILS/0/SD_ILS:3557742024-11-25T07:04:00Z2024-11-25T07:04:00ZYazar Leach, R. K.<br/>Yer Numarası ONLINE(355774.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781455777532">http://www.sciencedirect.com/science/book/9781455777532</a>
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