Arama Sonu&ccedil;lar&#305; Metrology. - Daralt&#305;lm&#305;&#351;: Optical measurements. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMetrology.$0026qf$003dSUBJECT$002509Konu$002509Optical$002bmeasurements.$002509Optical$002bmeasurements.$0026ic$003dtrue$0026ps$003d300?dt=list 2024-11-22T01:32:13Z Optical metrology ent://SD_ILS/0/SD_ILS:318819 2024-11-22T01:32:13Z 2024-11-22T01:32:13Z Yazar&#160;G&aring;svik, Kjell J.<br/>Yer Numaras&#305;&#160;ONLINE(318819.1)<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226</a> EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=79534">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=79534</a> MyiLibrary <a href="http://www.myilibrary.com?id=26972">http://www.myilibrary.com?id=26972</a> John Wiley <a href="http://dx.doi.org/10.1002/0470855606">http://dx.doi.org/10.1002/0470855606</a> Table of contents <a href="http://catdir.loc.gov/catdir/toc/wiley023/2002072607.html">http://catdir.loc.gov/catdir/toc/wiley023/2002072607.html</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Optical metrology ent://SD_ILS/0/SD_ILS:301055 2024-11-22T01:32:13Z 2024-11-22T01:32:13Z Yazar&#160;G&aring;svik, Kjell J.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/0470855606">http://dx.doi.org/10.1002/0470855606</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Optical imaging and metrology advanced technologies ent://SD_ILS/0/SD_ILS:306211 2024-11-22T01:32:13Z 2024-11-22T01:32:13Z Yazar&#160;Osten, Wolfgang.&#160;Reingand, Nadya.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://lib.myilibrary.com?id=369321">Connect to MyiLibrary resource.</a> <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916</a> Wiley <a href="http://dx.doi.org/10.1002/9783527648443">http://dx.doi.org/10.1002/9783527648443</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10575536">http://site.ebrary.com/lib/alltitles/Doc?id=10575536</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fringe pattern analysis for optical metrology : theory, algorithms, and applications ent://SD_ILS/0/SD_ILS:342225 2024-11-22T01:32:13Z 2024-11-22T01:32:13Z Yazar&#160;Serv&iacute;n, Manuel, author.&#160;Quiroga, J. Antonio (Juan Antonio), author.&#160;Padilla, J. Mois&eacute;s (Jos&eacute; Mois&eacute;s), author.<br/>Yer Numaras&#305;&#160;ONLINE(342225.1)<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414">http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414</a> ebrary <a href="http://site.ebrary.com/id/10881255">http://site.ebrary.com/id/10881255</a> John Wiley <a href="http://dx.doi.org/10.1002/9783527681075">http://dx.doi.org/10.1002/9783527681075</a> MyiLibrary <a href="http://www.myilibrary.com?id=615339">http://www.myilibrary.com?id=615339</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>