Arama Sonu&ccedil;lar&#305; Microelectromechanical systems -- Testing. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMicroelectromechanical$002bsystems$002b--$002bTesting.$0026ps$003d300? 2026-01-22T06:22:09Z Measurement technology for micro-nanometer devices ent://SD_ILS/0/SD_ILS:593078 2026-01-22T06:22:09Z 2026-01-22T06:22:09Z Yazar&#160;Zhang, Wendong, author.<br/>Yer Numaras&#305;&#160;TA418.9 .N35<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118717974">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118717974</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Special Topics in Structural Dynamics, Volume 6 Proceedings of the 33rd IMAC, A Conference and Exposition on Structural Dynamics, 2015 ent://SD_ILS/0/SD_ILS:530450 2026-01-22T06:22:09Z 2026-01-22T06:22:09Z Yazar&#160;Allemang, Randall. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-15048-2">https://doi.org/10.1007/978-3-319-15048-2</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>