Arama Sonuçları Microelectronics -- Materials -- Testing.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMicroelectronics$002b--$002bMaterials$002b--$002bTesting.$0026ps$003d300?dt=list2026-01-12T17:35:38ZDefects in microelectronic materials and devicesent://SD_ILS/0/SD_ILS:5431962026-01-12T17:35:38Z2026-01-12T17:35:38ZYazar Fleetwood, D. M. (Dan M.) Pantelides, Sokrates T. Schrimpf, Ronald Donald.<br/>Yer Numarası TK7871 .D44 2009<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420043778">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>The electronics handbookent://SD_ILS/0/SD_ILS:5464892026-01-12T17:35:38Z2026-01-12T17:35:38ZYazar Whitaker, Jerry C.<br/>Yer Numarası TK7867 .E4244 2005<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420036664">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>