Arama Sonuçları Microelectronics -- Measurement. - Daraltılmış: Elektronik Kütüphane
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMicroelectronics$002b--$002bMeasurement.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Elektronik$002bK$0025C3$0025BCt$0025C3$0025BCphane$0026ps$003d300?dt=list
2025-03-31T06:15:17Z
Thermal Sensors Principles and Applications for Semiconductor Industries
ent://SD_ILS/0/SD_ILS:530131
2025-03-31T06:15:17Z
2025-03-31T06:15:17Z
Yazar Jha, Chandra Mohan. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4939-2581-0">https://doi.org/10.1007/978-1-4939-2581-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Digital holography for MEMS and microsystem metrology
ent://SD_ILS/0/SD_ILS:305732
2025-03-31T06:15:17Z
2025-03-31T06:15:17Z
Yazar Asundi, Anand.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9781119997290">http://dx.doi.org/10.1002/9781119997290</a>
<a href="http://lib.myilibrary.com?id=317798">http://lib.myilibrary.com?id=317798</a>
<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697681">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697681</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electronic systems maintenance handbook
ent://SD_ILS/0/SD_ILS:286729
2025-03-31T06:15:17Z
2025-03-31T06:15:17Z
Yazar Whitaker, Jerry C.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420036855">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>