Arama Sonuçları Microelectronics -- Reliability. - Daraltılmış: Electronics.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dMicroelectronics$002b--$002bReliability.$0026qf$003dSUBJECT$002509Konu$002509Electronics.$002509Electronics.$0026ic$003dtrue$0026ps$003d300?
2026-02-20T23:57:13Z
Reliability prediction for microelectronics
ent://SD_ILS/0/SD_ILS:598968
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2026-02-20T23:57:13Z
Yazar Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.<br/>Yer Numarası TK7874<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
75th anniversary of the transistor
ent://SD_ILS/0/SD_ILS:598494
2026-02-20T23:57:13Z
2026-02-20T23:57:13Z
Yazar Nathan, Arokia, 1957- editor. Saha, Samar K., editor. Todi, Ravi M., editor.<br/>Yer Numarası TK7871.9<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394202478">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394202478</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes
ent://SD_ILS/0/SD_ILS:488642
2026-02-20T23:57:13Z
2026-02-20T23:57:13Z
Yazar Balasinski, Artur. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4614-1761-3">https://doi.org/10.1007/978-1-4614-1761-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>